The Keysight DSOV254A Infiniium V-Series oscilloscope delivers 25 GHz analog bandwidth across 4 channels for high-speed signal acquisition and analysis. Built for signal integrity debugging, jitter characterization, and serial data testing, this instrument combines deep memory, flexible sample rates, and advanced triggering to support demanding measurements in high-speed digital and RF design workflows.
Technical Specifications
• Bandwidth: 25 GHz analog (upgradable)
• Analog Channels: 4
• Sample Rate: 80 GSa/s (2 channels) / 40 GSa/s (4 channels)
• Acquisition Memory: 50 Mpts standard; expandable to 2 Gpts per channel
• ADC Resolution: 8 bits (expandable to 12 bits in high-resolution mode or with averaging)
• Noise Floor: 1.73 mV RMS at 50 mV/div
• Jitter Measurement Floor: 100 fs
• Effective Number of Bits (ENOB): >5.5 bits
• Spurious Free Dynamic Range: >50 dBc
• Display: 12.1-inch capacitive touchscreen, 1024 × 768 XGA resolution
• Resolution Bandwidth: 6 kHz (10 MB memory at 40 GSa/s); 2 kHz with optional memory
• Hardware Serial Trigger: Up to 12.5 Gbps data rates, 160-bit sequence length
• Storage: 500 GB removable SSD (1 TB option available)
• Supply Voltage Tolerance: ±10% nominal
– Key Features
• Five USB 3.0 ports (host/device) plus three USB 2.0 peripheral ports
• Ethernet 10/100/1000 Base-T connectivity
• Optional GPIB interface
• InfiniiMax III/III+ Series probe support (voltage, current, differential, active, and passive)
• Hardware DDR2/3/4 and LPDDR2/3/4 decode/trigger on MSO models
• Keysight I/O Libraries Suite and MATLAB compatibility
– Typical Applications
• High-speed digital signal integrity analysis
• Jitter and timing characterization
• Serial data protocol debugging (up to 12.5 Gbps)
• Memory interface validation
• Complex waveform capture and analysis
– Compatibility & Integration
Supports broad protocol decoding options and compliance testing. Includes four 500 MHz passive probes, probe accessory kit, calibration cable, front panel cover, keyboard, mouse, and comprehensive documentation.
