The Keysight DSOX3022T is a 200 MHz, 2-channel digital storage oscilloscope built around an 8.5-inch capacitive touchscreen display optimized for touch-driven workflows. It captures waveforms at 1,000,000 per second—an uncompromised update rate that exposes signal anomalies and transient behavior impossible to detect on slower instruments. The scope samples at up to 5 GSa/s per channel and stores 4 Mpts of acquisition memory, enabling detailed capture of complex signal behavior across extended time windows.
Technical Specifications
• Bandwidth: 200 MHz
• Channels: 2 analog
• Sample Rate: Up to 5 GSa/s (per channel, two channels active)
• Memory Depth: 4 Mpts per channel (two channels active)
• Waveform Capture Rate: 1,000,000 waveforms/second
• Rise Time: ≤1.75 ns
• ADC Resolution: 8 bits
• Input Impedance: 1 MΩ || 14 pF
• Maximum Input Voltage (DC): 400 V (10:1 probe)
• Safety Category: CAT I 800V
• Display: 8.5-inch color TFT LCD capacitive touchscreen
– Key Features
• Edge, pulse width, video, pattern, and runt pulse triggering
• Zone Touch Trigger for rapid signal isolation in complex waveforms
• Edge-then-edge, rise/fall time, Nth edge burst, and setup/hold triggers
• Protocol-based triggering and decoding (optional)
• USB 2.0 connectivity for peripheral control
• Optional LAN, video, and GPIB interfaces
• 6-in-1 instrument integration: oscilloscope, 3-digit voltmeter, 8-digit counter/totalizer, and protocol analysis
– Optional Capabilities
• Arbitrary Waveform Generator (DSOX3WAVEGEN): 20 MHz maximum frequency; sine, square, ramp, pulse, DC, sinc(x), exponential, cardiac, Gaussian pulse, and noise waveforms; AM, FM, and FSK modulation with sine, square, and ramp shapes
• Mixed Signal Oscilloscope (DSOXT3MSO): 16 integrated digital channels; up to 20 total time-correlated channels (2 analog + 16 digital)
• Serial Protocol Support: I²C, SPI, UART/RS232/RS485, CAN, CAN FD, LIN, SENT, CXPI, FlexRay, MIL-STD 1553, ARINC 429, USB PD, I²S
– Typical Applications
General-purpose analog troubleshooting, serial protocol debugging, mixed-signal validation, and waveform generation for circuit characterization.
