The Keysight DSOZ634A Infiniium Oscilloscope delivers 63 GHz real-time bandwidth for high-speed signal analysis in advanced IC design and technology development. This Z-Series instrument captures transient signals and high-frequency phenomena with noise and jitter measurement floors. RealEdge technology and indium phosphide chip architecture enable precise measurements of signals exceeding hundreds of gigabits per second, supported by deep memory and hardware-accelerated processing.
Technical Specifications
Bandwidth and Sampling
• Real-time bandwidth: Up to 63 GHz (2 channels); 33 GHz (4 channels)
• Maximum sample rate: 160 GSa/s (2 channels); 80 GSa/s (4 channels)
• Rise time capture: As fast as 5 ps (20/80)
• Maximum waveform update rate: >400,000 waveforms/second (segment memory mode)
Memory and Processing
• Standard memory depth: 50 Mpts per channel
• Maximum memory depth: 2 Gpts
• RAM: 16 GB standard
• Processor: Quad-core Intel (i5 or i7)
• Storage: 500 GB removable SSD
• Operating system: Windows
Signal Integrity
• Highest ENOB at bandwidth: Up to 63 GHz
• Clock recovery: On NRZ data rates as fast as 120 Gb/s
• Vertical resolution: 8 bits (≥12 bits with averaging)
• DC gain accuracy: ±2% of full scale at full resolution channel scale
Input Characteristics
• Input impedance: 50 Ω ±3%
• Sensitivity: 1 mV/div to 1 V/div
• Maximum input voltage: ±5 V steady state and transient
• Dynamic range: ±4 div from center screen
• Input coupling: DC
– Key Features
• 15.4-inch capacitive touchscreen with multi-touch gestures and XGA resolution (1024 × 768)
• 256-level intensity-graded color-coded waveform display
• Edge, glitch, and advanced trigger modes with auxiliary trigger
• Drag-and-drop positioning, instant waveform zoom, and simplified menu interface
• Hardware acceleration for fast processing
– Interfaces
• 10/100/1000-Base-T Ethernet with Web-enabled connectivity (UltraVNC)
• Multiple USB ports
– Typical Applications
High-speed serial link characterization, transient signal capture, jitter and noise analysis, and advanced modulation format testing for multi-gigabit per second communications and semiconductor device validation.
