The Agilent/Keysight E2613A is a wedge probe adapter engineered for non-invasive probing of Thin Quad Flat Pack (TQFP) and Plastic Quad Flat Pack (PQFP) surface-mount integrated circuits. This adapter eliminates the need for soldering, preventing accidental pin shorts and mechanical damage to component leads while maintaining signal integrity for accurate measurements with Agilent/Keysight logic analyzers and oscilloscopes.
Technical Specifications
Electrical Performance:
• Operating voltage: less than 40 V (DC + peak AC)
• Operating current: 0.5 A maximum
• Contact resistance: less than 0.1 Ω
• Capacitance between contacts: 2 pF (typical)
• Self-inductance: 15 nH (typical)
Physical Design:
• Pin spacing: 0.5 mm
• Dam bar gap requirement: 0.5 mm between IC pins
• Dual contact points per IC leg ensure redundant electrical connection and mechanical stability
• Non-invasive wedge segments designed to grip IC pins without deformation
– Key Features
• Three-signal probing capacity per adapter unit
• Dual-contact mechanism on each wedge segment for enhanced reliability
• Ultra-low parasitic inductance (15 nH typical) and minimal capacitive loading (2 pF typical)
• Mechanical design prevents IC leg damage during insertion and measurement
• Includes magnifying lens for precise pin targeting and visual alignment
– Typical Applications
The E2613A supports intricate debugging and validation of surface-mount IC designs, enabling direct electrical access to TQFP and PQFP pins without permanent modifications. Ideal for prototype verification, signal integrity analysis, and design troubleshooting workflows.
– Compatibility & Integration
Probe Interfaces:
Connects directly to Keysight 1145A and 1155A active probes, or to passive probes via adapter kits: 1160/1/2/3/4/5A series (dual-lead adapter required) or N2870A series (requires N2877A/N2879A accessory kits).
Instruments:
Fully compatible with Keysight logic analyzers and oscilloscopes. A flexible lead between probe and adapter maintains stable contact and prevents dislodging from probe weight.
