The Agilent/Keysight E2615A is a 0.65 mm pitch wedge probe adapter engineered for non-invasive testing of Thin Quad Flat Pack (TQFP) and Plastic Quad Flat Pack (PQFP) surface mount integrated circuits. This adapter eliminates the need for soldered wire connections or manual multi-probe setups, delivering mechanically safe contact with IC leads while maintaining electrical integrity.
Technical Specifications
• Pitch spacing: 0.65 mm
• Contact count: 3
• Operating voltage: Less than 40 V (DC + peak AC)
• Maximum operating current: 0.5 A
• Capacitance between contacts: 2 pF (typical)
• Self-inductance: 15 nH (typical)
• Contact resistance: Less than 0.1 Ω
– Key Features
• Dual contact points per IC leg provide redundant electrical connections and enhanced reliability. This dual-contact architecture reduces contact resistance variability and improves signal integrity during extended test cycles.
• Mechanically non-invasive design prevents deformation or damage to IC leads, enabling repeated testing without degradation.
• Wedge probe interface delivers consistent, repeatable contact force across all connection points.
• Low parasitic inductance (15 nH typical) and minimal capacitance (2 pF typical) preserve signal fidelity for high-speed or analog applications.
– Typical Applications
• In-circuit functional testing of TQFP and PQFP packages
• Development and verification of surface mount assemblies
• Rework and failure analysis where lead integrity must be maintained
– Compatibility & Integration
• Interfaces exclusively with Keysight 10070-series probes
• Supports TQFP and PQFP package types only
• Rated for DC and AC peak signals up to 40 V; DC current capability to 0.5 A
