The Agilent/Keysight E8362C is a high-performance PNA Series vector network analyzer that characterizes RF and microwave components from 10 MHz to 20 GHz with 123 dB dynamic range and sub-microsecond measurement speed. Built on a flexible platform for aerospace, defense, telecommunications, and research applications, it delivers trace noise below 0.006 dB rms and supports up to 32 measurement channels with 20,001 points per channel.
Technical Specifications
• Frequency Range: 10 MHz to 20 GHz
• Dynamic Range: 123 dB at 20 GHz at test port
• Trace Noise: < 0.006 dB (0.002 dB rms at 1 kHz bandwidth)
• Measurement Speed: 4.5 to 26 µsec/point
• Thermal Stability: 0.05 dB/°C
• Measurement Channels: 32 (up to 20,001 points per channel)
• Test Ports: 3.5 mm male 50-ohm connectors
• Maximum Output Level: 10 dBm
• Source Attenuator: 60 dB in 10 dB steps
• Display: 8.4 inch color LCD
– Key Features
• Built-in 2-port S-parameter test set with 3.5 mm connectors
• Advanced calibration: TRL/LRM, QSOLT, vector error correction, and N-port techniques
• On-wafer, in-fixture, waveguide, and antenna measurement support
• Wide ECal module compatibility
• Mixer characterization: conversion loss/gain, match parameters, isolation, compression, group delay, and scalar/vector calibration modes
• Amplifier measurements including gain compression, harmonic, IMD, and pulsed-RF analysis
• Frequency converter and offset measurements with selectable embedded LO capability
• Single-ended and balanced measurement modes
• Multiport configurations with full cross-bar optimization
• Pulsed-RF measurement support
– Typical Applications
Component characterization in aerospace and defense systems, telecommunications infrastructure testing, research laboratory measurements, on-wafer device characterization, and integrated circuit validation.
– Compatibility & Integration
The analyzer integrates with industry-standard 3.5 mm 50-ohm test fixtures and supports multiple calibration standards. Options available for scalar-calibrated converter measurements, frequency converter applications, embedded LO measurements, pulsed-RF capability, and high-power measurements.
