The Keysight M9374A is a two-port PXIe Vector Network Analyzer engineered for RF and microwave component characterization in automated test systems and manufacturing environments. This single-slot module delivers high dynamic range, low trace noise, and excellent stability for precise S-parameter and time-domain measurements. It supports frequency-selectable configurations, allowing you to purchase only the bandwidth required, and cascades with additional modules for multiport or multi-site testing to reduce cost-of-test and improve throughput.
Technical Specifications
Frequency & Performance
• Frequency range: 300 kHz to 20 GHz (M9374A); M937xA series options extend to 26.5 GHz
• Dynamic range: >115 dB at 9 GHz, >110 dB at 20 GHz
• Trace noise: <0.003 dB (standard deviation at 1 kHz IFBW)
• Stability: ±0.005 dB/°C at 4 GHz, ±0.020 dB/°C at 26.5 GHz
Measurement Capability
• Sweep speed: 18 msec across 401 points (6 ms across 201 points at 600 kHz IFBW)
• Maximum measurement points: 100,001
• Receiver architecture: Full two-receiver, true four-receiver design
• Output power: +7 to −40 dBm (0.01 dB resolution)
Physical
• Form factor: Single PXIe slot (128.4 × 212.6 × 19.9 mm, 0.59 kg)
– Key Features
• Measures gain, return loss, isolation, group delay, and compression parameters
• Performs linear and nonlinear device characterization in frequency and time domains
• Built-in calibration software with perpetual licenses (performance test and standards-compliant modes)
• Electronic calibration (ECal) via USB for fast, accurate calibrations
• Cascadable architecture supports up to 32-port configurations or full N-port correction
• Optional modules: automatic fixture removal (007), frequency offset/scalar calibrated converter (009), time domain (010)
– Typical Applications
Component S-parameter characterization, manufacturing test automation, device compression analysis, multiport network evaluation, and time-domain pulse response measurement.
– Compatibility & Integration
PXIe and hybrid chassis compatible. Configurable for multi-site testing to maximize throughput. Supports cascading of multiple modules within a single test system.
