The Keysight M9380A is a modular PXIe continuous wave (CW) source engineered for high-speed automated test system integration. Composed of three integrated PXIe modules—the M9310A source output, M9301A synthesizer, and M9300A frequency reference—this instrument delivers stable, accurate signal generation across 1 MHz to 3 GHz or 6 GHz. Output power reaches +18 dBm to +19 dBm depending on frequency band and manufacturing revision. Phase noise performance of < −122 dBc/Hz at 1 GHz (20 kHz offset) supports demanding component testing, local oscillator substitution, and interference injection applications.
Technical Specifications
Frequency Coverage: 1 MHz to 3 GHz (standard) or 1 MHz to 6 GHz (optional, via license key upgrade)
Output Power: +18 dBm to +19 dBm across frequency range (±0.01 dB settable resolution). Manufacturing revision-dependent specifications apply: units with higher serial numbers support +10 dBm to +19 dBm (1 MHz to 5 GHz) and +10 dBm to +18 dBm (5 GHz to 6 GHz). Earlier revisions deliver +10 dBm to +19 dBm (1 MHz to 2.5 GHz) and +10 dBm to +18 dBm (2.5 GHz to 6 GHz).
Amplitude Accuracy: Better than ±0.4 dB absolute; degrades ±0.02 dB/°C outside controlled temperature range (20–30 °C)
Phase Noise: < −122 dBc/Hz at 1 GHz (20 kHz offset); −122 dBc/Hz at 10 kHz offset
Spectral Purity: −29 dBc harmonics (at 1 GHz); −70 dBc non-harmonics (at 1 GHz)
Frequency Switching Speed: 5 ms
Frequency Stability: < ±0.5 ppb/day aging (post 72-hour warm-up); < ±0.1 ppm/year
Frequency Accuracy (Internal Timebase): ± 10 ppb (controlled temperature); ± 50 ppb (full temperature range). Warm-up: < ±0.1 ppm (5 minutes) or < ±0.01 ppm (15 minutes) over 20–30 °C
External Reference: 1 MHz to 110 MHz sine wave input; ±1 ppm nominal lock range
– Key Features
• Compact modular architecture fits PXIe infrastructure
• Fast frequency switching supports multi-channel test sequences
• Low phase noise enables precision LO applications
• Frequency range upgradeable via software license
• VSWR specified across full frequency range
– Typical Applications
• Component and subsystem RF testing
• Local oscillator substitution in receiver chains
• Interference and rejection testing
• Stimulus generation for automated measurement systems
– Compatibility & Integration
Native PXIe form factor integration with high-speed data interfaces enables tight coupling to test platforms. Supports external frequency reference inputs for synchronized multi-instrument operation.
