The Agilent/Keysight P5027A is a four-port USB Vector Network Analyzer delivering S-parameter measurements to 44 GHz in a compact form factor. This instrument combines the measurement science of Keysight’s flagship PNA, ENA, and PXI VNAs into a space-efficient design controlled via external computer. The P5027A supports multiport calibrated measurements, pulsed-RF analysis, time-domain characterization, and noise figure measurements with vector correction—making it suitable for rapid component and system characterization across RF and microwave frequencies.
Technical Specifications
• Frequency Range: 100 kHz to 44 GHz
• Ports: 4 (2.4 mm female connectors)
• Dynamic Range: 132 dB
• Output Power: 5 dBm
• Power Sweep Range: −50 dBm to +5 dBm
• Noise Floor: −127 dBm
• Harmonic Content: −15 dBc
• Port Impedance: 50 Ohms
• Reference Input/Output: MCX connectors
• Interfaces: USB 3.0, GPIB, Ethernet/LAN, RS-232
• Dimensions: 176 × 68 × 333 mm (W × H × D)
• Weight: 3.18 kg
• Operating Temperature: 0 to 50 °C
– Key Features
• Embedded local oscillator with source phase control capability
• Automatic fixture removal for efficient de-embedding
• Spectrum analysis and vector signal analysis hardware options
• Pulse modulation available for internal sources
• Electronic calibration (ECal) module compatibility across Keysight’s module portfolio
• Optional second source (Option 402) for differential measurements
• Calibration documentation options including ANSI Z540-1-1994 accreditation
– Typical Applications
• Pulsed-RF component and amplifier characterization
• Gain compression and spectral purity measurements
• Time-domain reflectometry and impedance analysis
• Noise figure assessment with vector correction
• Multiport device characterization and phase coherence analysis
– Compatibility & Integration
The P5027A shares the same graphical user interface and measurement methodology as Keysight’s high-performance PNA platform, enabling consistent workflows across benchtop and modular instruments. Multiple software options extend capability for complex measurement scenarios including basic pulsed-RF analysis, multi-instrument coordination, and advanced source control.
