The Keysight W2635A is a DDR3 BGA probe adapter that enables direct signal access to Ball Grid Array memory components for oscilloscope-based electrical and timing measurements. Soldered between the DRAM and PCB or DIMM raw card, this in-circuit adapter brings 20 signals to surface-mount pads for probing, supporting DDR3 x4, x8, and x16 packages in full compliance with JEDEC specification JESD79-3A.
Technical Specifications
• Adapter Dimensions: Two configurations available
– W2635A-010: Height 13.97 mm (0.550 in), Width 11.176 mm (0.440 in), Thickness 1.575 mm (0.062 in)
– W2635A-011: Height 13.97 mm (0.550 in), Width 12.192 mm (0.480 in), Thickness 1.575 mm (0.062 in)
• Signal Count: 20 signals routed to SMT pads
• Soldering: Lead-free temperature profile compatible
• Internal Design: Buried resistors provide signal isolation and minimize capacitive loading
– Key Features
• Direct access to clock, strobe, data, address, and command signals
• Through-connection architecture passes signals from memory controller and DRAM directly to probe pads
• DDR3 JEDEC compliance testing capability per JESD79-3A
• Dual width options accommodate varying DRAM placement spacing on production boards
– Typical Applications
• DDR3 design validation and debug
• Memory subsystem electrical characterization
• Timing margin analysis
• Signal integrity assessment in DDR3 implementations
– Compatibility & Integration
• Oscilloscopes: Keysight Infiniium 9000, 90000, and 90000 X-Series models
• Probe Heads: Keysight InfiniiMax E2677A, N5381A, N5425A, N5426A differential solder-in probes
• DRAM Support: DDR3 x4, x8, x16 packages
