The Ametek VT1501A is an 8-channel Direct Input Signal Conditioning and Processing (SCP) module engineered for VXI Technology systems. It delivers signal conditioning and input protection for direct sensor connections, enabling accurate multi-channel data acquisition in demanding measurement environments. The module integrates as a plug-on SCP onto host VXI cards such as the VT1415A and VT1422A, expanding their input capability and creating flexible, scalable signal conditioning architectures.
Technical Specifications
Module Configuration
• Model: VT1501A
• Type: 8-Channel Direct Input SCP Module
• Form Factor: Plug-on SCP module for VXI host cards
• Channels: 8
• Input Type: Direct input with signal conditioning and processing
Performance
• Measurement Accuracy: ±0.01% of input level (typical with VT1415A/VT1422A at 23 °C ± 1 °C after warm-up)
• Specifications: Calibration procedures influence achievable accuracy
System Integration
• Architecture: VXIbus-compatible
• Primary Hosts: VT1415A, VT1422A scanning measurement and control modules
• Additional Compatibility: Accepts other VXI cards designed for SCP module integration
– Key Features
• Direct input signal conditioning for multiple sensor types
• Input protection on each eight-channel input block
• Modular SCP design allows cascading with other SCP modules for diverse signal inputs
• Voltage measurement capability when paired with compatible host modules
• Temperature-stabilized accuracy specifications after warm-up period
– Typical Applications
The VT1501A addresses high-reliability applications requiring accurate, multi-channel sensor data acquisition. Its direct input architecture suits voltage measurements and general sensor conditioning tasks, particularly in systems leveraging VXI scanning measurement platforms.
– Compatibility & Integration
Designed specifically for VXI Technology ecosystems, the VT1501A functions as a plug-on module onto compatible VXI host cards. Multiple SCP modules can be combined to create comprehensive signal conditioning solutions tailored to different input characteristics and measurement requirements.
