The Anritsu 37269D is a 2-port vector network analyzer operating from 40 MHz to 40 GHz, engineered for S-parameter characterization across telecommunications, aerospace, defense, and RF component testing applications. It delivers fast measurement speeds under 5 ms per point with up to 1,601 discrete data points, supporting S11, S21, S22, S12, and custom a1/a2/b1/b2 combinations. The instrument combines high dynamic range—up to 115 dB at 2 GHz—with low noise floors reaching −107 dBm at 2 GHz and −97 dBm at 40 GHz, enabling precise phase and magnitude analysis across frequency, CW, and optional high-speed time-domain measurements.
Technical Specifications
• Frequency Range: 40 MHz to 40 GHz
• Measurement Parameters: S11, S21, S22, S12, user-defined combinations of a1, a2, b1, b2
• Measurement Domains: Frequency, CW Draw, optional High Speed Time (Distance) Domain
• Measurement Points: Up to 1,601 discrete data points (2 ≤ N ≤ 1,601)
• Measurement Speed: <5 ms/point
• Port 1 Power: 10 dBm @ 40 MHz; 2 dBm @ 40 GHz
• Noise Floor (Port 2, RMS): −85 dBm @ 40 MHz; −107 dBm @ 2 GHz; −97 dBm @ 40 GHz
• System Dynamic Range: 95 dB @ 40 MHz; 115 dB @ 2 GHz; 99 dB @ 40 GHz
• IF Bandwidth: 10 kHz to 10 Hz
• Display: 8.4-inch TFT color LCD
• Power Supply: 100–240 VAC, 50/60 Hz
– Key Features
• Storage via 8 GB SD card, USB memory devices, and integrated hard-disk drive
• Ten front-panel states storable without calibration data; automatic setup backup at power-down
• Measurement data export in text, S2P, or bitmap formats
• IEEE 488.2 GPIB support (dual ports: system and dedicated)
• Ethernet connectivity with command syntax compatible to GPIB
• Parallel I/O for external test set control and bias voltage management
• Rear-panel IF inputs for millimeter-wave upgrade capability
• Serial interface for Autocal® module control
– Typical Applications
• Telecommunications filter and amplifier characterization
• Aerospace and defense component validation
• Satellite and radar system RF analysis
• Broadband communication device testing
– Compatibility & Integration
USB, GPIB, LAN, VGA, and parallel I/O enable integration into automated test environments. Optional 4A secure SD card slot supports dual storage for data segregation and operating system backup.
