The Anritsu 69069A is a synthesized CW generator delivering precision frequency synthesis across 0.01 to 40 GHz. Built for RF component characterization, signal simulation, and automated test setups, this instrument combines fast switching, low phase noise, and stable frequency accuracy to meet the demands of laboratory and field-based RF engineers.
Technical Specifications
Frequency Performance
• Range: 0.01 to 40 GHz
• Resolution: 1 kHz (0.1 Hz with Option 11)
• Aging rate (standard time base): < 2 × 10⁻⁸ per day
• Aging rate (Option 16 high-stability time base): < 5 × 10⁻¹⁰ per day
• Temperature coefficient (standard): < 2 × 10⁻⁸/°C over 0–55 °C
• Temperature coefficient (Option 16): < 2 × 10⁻¹⁰/°C
• Warm-up time from standby: 30 minutes
• Warm-up from cold start (0 °C, standard): 120 hours to achieve < 2 × 10⁻⁸ per day
Output Characteristics
• Output impedance: 50 Ohms
• Power resolution: 0.01 dB
• Maximum leveled output: +10 dBm or manufacturer specification, whichever is lesser
Signal Purity
• SSB phase noise (typical): −100 dBc at 10 kHz offset from 10 GHz
• Harmonic spurious (≥500 MHz to ≤2.2 GHz): < −50 dBc
• Harmonic spurious (≥10 MHz to ≤50 MHz): 50 MHz to ≤2 GHz): < −40 dBc
Sweep Capabilities
• Step sweep: 1 to 10,000 steps with variable dwell time (1 ms to 99 seconds)
• Switching time: < 15 ms + 1 ms/GHz or < 40 ms, whichever is less
• Analog sweep: 1 MHz to full range, independently selected
– Key Features
• 1 kHz frequency resolution across full band; 0.1 Hz with Option 11
• Excellent long-term stability with high-stability time base option
• Ultra-low phase noise for precision signal simulation
• Fast step switching for automated test sequences
• Selectable sweep modes for frequency characterization
– Typical Applications
• RF component and subsystem testing
• Signal source simulation for receiver analysis
• Automated test equipment (ATE) integration
• Phase noise and spectral purity measurement
– Compatibility & Integration
The 69069A accepts internal and external 10 MHz time base references, enabling synchronization with external frequency standards and integrated test systems.
