The Anritsu ME7838A4X VectorStar is a 4-port broadband vector network analyzer delivering S-parameter measurements from 70 kHz to 125 GHz with optional millimeter-wave module configurations extending to 1.1 THz. The instrument combines dynamic range exceeding 140 dB (102 dB at 220 GHz) with measurement stability of 0.1 dB over 24 hours, enabling precise characterization of passive components, active devices, and complex broadband/millimeter-wave circuits. Measurement speed reaches 55 ms for 201 points at 10 kHz IFBW.
## Technical Specifications
• **Frequency Range:** 70 kHz to 125 GHz (guaranteed); configurable to 1.1 THz with banded millimeter-wave modules
• **Dynamic Range:** >140 dB; 102 dB at 220 GHz
• **Measurement Stability:** 0.1 dB over 24 hours; typical ≤0.1 dB and 1° S₂₁ stability over 24 hours at 25°C
• **Measurement Speed:** 55 ms for 201 points at 10 kHz IFBW
• **Port Configuration:** 4-port single-ended, mixed-mode, and true differential mode
• **Calibration:** Precision AutoCal™ units for guided calibration procedures
## Key Features
• **Spectrum Analyzer Option (Option 49):** Single-sweep coverage from 70 kHz to 220 GHz; supports banded configurations to 1.1 THz. Dual SPA mode for mixer, amplifier, harmonic, and spurious testing. Selectable detection types (peak, minimum, RMS, mean) with tracking generator capability.
• **Noise Figure Measurement:** Compatible with 3744x-Rx receiver for noise figure up to 125 GHz—the only VNA platform covering 70 kHz to 125 GHz. Optimized noise receiver available for 30 GHz to 125 GHz. Differential noise figure option for characterizing differential devices. Cold-source-based noise figure option for enhanced accuracy.
• **Millimeter-Wave Modules:** NLTL technology-based compact modules with 0.6 mm test port connectors for measurements to 220 GHz. Optimized for space-constrained wafer probe station mounting with superior raw directivity.
• **Differential Measurements:** Full support for differential and mixed-mode characterization across the frequency range.
