The Anritsu ME7838AX VectorStar Broadband Vector Network Analyzer delivers precise S-parameter measurements across microwave and millimeter-wave frequencies in a single sweep. Operating from 70 kHz to 125 GHz with optional extension to 220 GHz and up to 1.1 THz via specialized mmWave modules, this instrument combines wide frequency coverage with exceptional dynamic range. Its compact architecture leverages Nonlinear Transmission Line (NLTL) technology for direct on-wafer integration, eliminating the need for larger probe station footprints.
## Technical Specifications
**Frequency Coverage**
• Base range: 70 kHz to 125 GHz (single sweep)
• Extended coverage with mmWave modules: up to 220 GHz and 1.1 THz
• Optional low-frequency operation: 70 kHz (8 additional octaves for improved DC extrapolation in device modeling)
• Guaranteed specifications available up to 125 GHz
**Dynamic Range**
• 109 dB at 110 GHz
• 102 dB at 220 GHz
• Pulse measurements: 100 dB dynamic range with 2.5 ns resolution via PulseView™
**Calibration & Stability**
• Measurement stability: better than 0.1 dB over 24 hours or 0.05 degrees over 24 hours
• Positive raw directivity across multiple bands extends intervals between calibrations
## Key Features
• S-parameter measurements across full frequency span
• Noise figure characterization to 125 GHz using 3744x-Rx receiver
• Differential noise figure capability for device assessment
• On-wafer optimization with compact mmWave modules for direct probe connection
• Time domain analysis with superior resolution across broadband coverage
• 2.5 ns pulse resolution enabling high-speed transient characterization
• Single-connection switching between S-parameter and IMD measurements
## Typical Applications
• On-wafer device and circuit characterization
• Millimeter-wave component validation
• Noise figure and gain measurements
• Pulse and time-domain analysis
• IMD and nonlinear device testing
## Compatibility & Integration
Compact mmWave modules integrate directly with standard on-wafer probe stations, maximizing dynamic range while maintaining measurement stability across extended frequency coverage.
