The Anritsu ME7838G VectorStar Broadband Vector Network Analyzer delivers accurate S-parameter measurements across an extensive frequency range, making it ideal for testing components and systems in aerospace, defense, and advanced communications. The instrument performs single continuous frequency sweeps from 70 kHz to 220 GHz, eliminating system concatenation and enhancing measurement accuracy for wideband devices. Its Nonlinear Transmission Line (NLTL) technology enables precise on-wafer measurements at sub-terahertz frequencies through direct probe connection to millimeter-wave modules, circumventing traditional coaxial connector limitations at these frequencies.
## Technical Specifications
• **Frequency Range:** 70 kHz to 220 GHz single sweep; operational 40 kHz to 226 GHz; millimeter-wave waveguide coverage to 1.1 THz
• **System Configuration:** 2-port vector network analyzer; 4-port variant (ME7838G4) available
• **Dynamic Range:** 74–119 dB; 120 dB at 10 MHz; 112 dB at 67 GHz; 109 dB at 110 GHz; 108 dB at 110 GHz; 102 dB at 220 GHz; 100 dB at 145 GHz
• **Output Power:** −18 to +10 dBm
• **Noise Floor:** −123 to −83 dBm
• **Measurement Parameters:** S-parameters
• **Linearity:** 1–4 dB
• **Calibration Stability:** 0.1 dB over 24 hours
• **Measurement Speed:** 310 ms for 401 points at 10 kHz IFBW
• **Port Impedance:** 50 Ω (70 kHz to 220 GHz VNA system; 50 GHz to 1.1 THz millimeter-wave configuration)
## Key Features
• mmWave modules employing NLTL technology; compact design at approximately 0.6 lb with 1/50 volume reduction versus traditional modules
• Direct 220 GHz probe connection for stable on-wafer measurements
• Noise figure measurements to 125 GHz via 3744x-Rx receiver; differential noise figure support; optimized 30–125 GHz receiver band
• Power control: base VNA for frequencies below 54 GHz; MA25400A mmWave module for frequencies above 54 GHz
• Tri-axial Kelvin bias tee connections for on-wafer device biasing
## Typical Applications
Aerospace and defense component characterization; advanced communications system testing; on-wafer device measurements; sub-terahertz frequency analysis.
## Compatibility & Integration
Supports 3744x-Rx receiver for extended noise figure measurement capability. MA25400A mmWave module integration for high-frequency power control.
