The Anritsu ME7838G4 VectorStar is a 4-port broadband vector network analyzer delivering S-parameter measurements from 70 kHz to 220 GHz in a single sweep, with operational capability extending to 226 GHz. The instrument integrates Nonlinear Transmission Line (NLTL) technology within compact mmWave modules to achieve calibration and measurement stability of 0.1 dB over 24 hours. This enables precise device characterization from near-DC through G-band frequencies, supporting first-pass design success.
## Technical Specifications
**Frequency Coverage**
• Broadband measurement: 70 kHz to 220 GHz (single sweep)
• Operational range: 40 kHz to 226 GHz
• mmWave waveguide coverage extends to 1.1 THz with appropriate modules
**Performance Metrics**
• Dynamic range: 112 dB at 67 GHz, 108 dB at 110 GHz, 100 dB at 140 GHz, 102 dB at 220 GHz
• Measurement speed: 310 ms for 401 points at 10 kHz IFBW
• Test port directivity, source match, and load match: up to 50 dB
• High compression point level: +15 dBm at 70 GHz
• Source output power: up to +14 dBm per independent source
## Key Features
• **4-port configuration** for complex component S-parameter analysis
• **NLTL technology** in compact MA25400A mmWave modules with 0.6 mm test port connectors
• **Spectrum analyzer option (Option 49)**: single-sweep operation 70 kHz to 220 GHz with dual SPA mode for mixer and harmonic testing
• **Noise figure measurement**: 70 kHz to 125 GHz, with optimized receiver for 30 GHz to 125 GHz bands
• **Differential measurement capability** supporting true mode stimulus analysis
• **Pulse measurement**: PulseView™ software with 2.5 ns resolution and 100 dB dynamic range
• **Tri-axial Kelvin bias tees** for on-wafer device biasing to 220 GHz
• **Real-time power leveling** without calibration software requirement
## Typical Applications
Device characterization across mmWave and sub-mmWave bands, on-wafer component testing, harmonic and distortion product analysis, noise figure assessment, and pulsed device evaluation.
## Compatibility & Integration
Compact mmWave modules enable economical integration with lightweight construction optimized for precise positioning. The system supports bias tee connections for active device testing across the full frequency range.
