The Astronics/EADS/Racal 4152A is a 6.5-digit VXIbus digital multimeter engineered for high-throughput automated test systems. This single-slot C-size VXI module delivers simultaneous DC and AC voltage and current measurements alongside 2/4-wire resistance, frequency, and DC ratio capabilities—all in one compact instrument. Built for production environments requiring rapid measurement cycles, the 4152A supports limit testing, averaging, math operations, and vector calculations with exceptional switching speed: up to 65 range changes per second and 30 function changes per second.
## Technical Specifications
• **Form Factor:** Single-slot, C-size VXIbus module
• **Resolution:** 6.5 digits
• **Measurement Functions:** DC voltage (1 V, 10 V, 100 V, 300 V ranges); AC voltage (1 V, 10 V, 100 V, 300 V ranges); DC current (1 A, 3 A ranges with 1% overrange on 3 A); AC current (1 A, 3 A ranges); 2-wire and 4-wire resistance (1 kΩ, 10 kΩ, 100 kΩ ranges); frequency (10 Hz to 1000 Hz); DC ratio measurements
• **Reading Speed:** Up to 6 readings/second at 6.5 digits with 0.0019% accuracy; up to 1000 readings/second at 4.5 digits
• **Frequency Measurement:** Gate times selectable at 10 ms, 100 ms, or 1 s; accuracy ±4% of reading ±1% of full scale (10–500 Hz) or ±5% of reading ±1% of full scale (500–1000 Hz)
• **AC Voltage Accuracy:** 100 mV to 100 V ranges specified for sine wave input exceeding 5% of range; 300 V range specified for sine wave input exceeding 15% of range; 300 VAC limited to 50 kHz
• **2-Wire Resistance:** Add 0.2 Ω additional error (or use Math Null function)
• **Operating Temperature:** 0 °C to 55 °C
## Key Features
• Fast function and range switching enables rapid test cycle times
• Math and vector operations for on-instrument data processing
• Frequency measurement with multiple gate time options for resolution/speed trade-off
• DC ratio capability for ratiometric testing
• Native support for LabWindows/CVI and LabVIEW environments
## Typical Applications
Automated production test systems, component characterization, board-level functional testing, high-volume manufacturing environments.
## Compatibility & Integration
VXIbus architecture with standard instrument drivers for LabWindows/CVI and LabVIEW integration.
