The GGB Industries/Picoprobe 18B-1-20 is a replacement probe tip engineered for high-frequency signal acquisition in semiconductor and electronics testing. Featuring electrochemically sharpened tungsten wire, this probe tip maintains signal integrity across DC to 350 MHz while minimizing contact damage through controlled tip flexibility. The 20 micron wire diameter offers balanced performance for general-purpose probing of submicron MOS technology nodes.
## Technical Specifications
• **Probe Wire Diameter:** 20 micron tungsten
• **Tip Point Radius:** Less than 1 micron (electrochemically sharpened)
• **Frequency Response:** DC to 350 MHz
• **Input Capacitance:** 0.02 pF nominal; approximately 0.06 pF for signals with 1 ns or shorter rise/fall times
• **Input Impedance:** High impedance with negligible leakage current (10 femtoamps)
• **Rise/Fall Time:** 1.2 ns (for signals 3 ns or longer)
• **Signal Attenuation:** 20:1 with 50-ohm oscilloscope input
• **Operating Voltage Range:** 0 to +15 V (Model 18B) or -7 to +8 V (Model 19)
## Key Features
• Electrochemically sharpened tungsten tip for fine-pitch probing
• Flexible wire diameter minimizes mechanical damage to circuit and probe during contact
• Maintains electrical contact stability under probe table vibration
• Replaceable tip assembly reduces downtime and cost following damage
• Low input capacitance supports fast transient measurements
• High input impedance prevents circuit loading
## Typical Applications
• High-frequency circuit characterization and troubleshooting
• Submicron MOS technology validation and failure analysis
• High-speed signal acquisition on densely routed PCBs
• Parametric testing where minimal contact force is required
## Compatibility & Integration
Designed for GGB Industries Picoprobe Models 18B and 19. Mounts on any standard micropositioner for integration with existing probing platforms. MOS input circuitry on the probe tip requires electrostatic discharge protection during handling and use.
