The HP/Agilent 16192A is a parallel electrode SMD test fixture designed for precision impedance characterization of surface mount devices. It delivers stable, repeatable connections across a wide frequency spectrum, enabling accurate measurement of impedance, S-parameters, and material dielectric properties. The fixture accommodates standard SMD package sizes and integrates with leading Agilent/HP impedance and network analyzers for laboratory and production environments.
Technical Specifications
• Fixture Type: Parallel electrode configuration for consistent contact with SMDs
• Measurement Capabilities: Impedance, S-parameters, material dielectric properties
• Device Compatibility: Standard SMD package sizes (0402, 0603, 0805, 1206, and others)
• Contact Resistance: Designed for low contact resistance to minimize measurement error
• Frequency Range: MHz to GHz operation; specific limits depend on connected impedance analyzer
• Calibration Methods: Supports Short-Open-Load-Thru (SOLT) de-embedding
• DUT Securing: Integrated mechanism for stable electrical contact during testing
– Key Features
• Parallel electrode design ensures uniform contact pressure across SMD terminations
• Low contact resistance minimizes systematic measurement error
• Signal integrity maintained across intended frequency range with minimal loss and distortion
• Electromagnetic shielding reduces external EMI and crosstalk for high-precision measurements
• Optimized impedance matching for RF and microwave measurement systems
– Typical Applications
• Characterization of capacitors, inductors, and resistors at multiple frequencies
• Material property evaluation (permittivity, permeability, loss tangent)
• Network parameter measurements across broadband frequency ranges
• Production testing and quality assurance of SMD components
– Compatibility & Integration
The fixture interfaces with Agilent/HP impedance and network analyzers including the 4192A, 4294A, E4990A series and equivalent Keysight instruments. Specialized connector design ensures low-impedance coupling with analyzer front ends. Physical integration with standard benchtop measurement setups is supported.
