The HP/Agilent 4339B is a precision DC high-resistance meter engineered for accurate measurement of insulation resistance, high-value resistors, capacitors, and semiconductor materials. It delivers a 1 MΩ to 10 TΩ measurement range with adjustable test voltages from 10 V to 1000 V DC, enabling detailed characterization of component behavior under varying electrical stress. The instrument combines voltage-current measurement principles with advanced analysis functions including dielectric absorption ratio (DAR) and polarization index (PI) calculations, making it essential for R&D, quality control, and manufacturing applications demanding reliable high-resistance metrology.
Technical Specifications
Resistance Measurement
• Range: 1 MΩ to 10 TΩ
• Accuracy: ±0.5% on 1 MΩ to 100 GΩ range at 100 V (representative specification)
• Measurement technique: Voltage-current (V-I) principle
Test Voltage
• Range: 10 V to 1000 V DC
• Setting resolution: 1 V increments
• Accuracy: ±1% of setting ±5 V
• Stability: ±0.5% over 30 minutes post warm-up
Measurement Functions
• Resistance (R), leakage current (I), applied voltage (V), capacitance (C), and time-dependent parameters
• Dielectric absorption ratio (DAR): 30-second to 60-second resistance ratio
• Polarization index (PI): 10-minute to 1-minute insulation resistance ratio
• Time constant (τ): Calculated from R and C measurements
Display & Interface
• LCD display for measured values and settings
• GPIB interface for automated control and data acquisition
– Key Features
• Wide 1 MΩ to 10 TΩ dynamic range captures both low and ultra-high resistance values
• Adjustable DC test voltages enable stress-dependent material characterization
• Dielectric absorption and polarization index calculations assess long-term insulation integrity
• Settling time varies by range and capacitance; typical response within minutes for high resistance
• Polarization effect compensation minimizes measurement distortion in dielectric materials
– Typical Applications
• Insulator characterization and acceptance testing
• High-resistance and resistor networks validation
• Semiconductor substrate and device leakage assessment
• Capacitor dielectric quality and long-term reliability evaluation
• Cable and connector insulation resistance trending
– Compatibility & Integration
GPIB connectivity enables integration into automated test systems and data logging workflows for production and field reliability programs.
