The HP/Agilent 54502A is a 400 MHz digitizing oscilloscope designed for signal acquisition and analysis in design verification, manufacturing test, and research environments. This dual-channel instrument captures both repetitive and single-shot signals with real-time sampling up to 400 MSa/s and delivers 400 MHz bandwidth in repetitive mode, 100 MHz in single-shot mode. With 2001-point memory depth in real-time acquisition and programmable triggering down to 1.75 ns glitch detection, the 54502A provides the timing resolution and measurement capability required for precision electronic testing.
## Technical Specifications
**Bandwidth**
• Repetitive mode: DC to 400 MHz (-3 dB, DC coupled)
• Real-time (single-shot) mode: DC to 100 MHz (-3 dB, DC coupled)
• Bandwidth reduces to 100 MHz at 1 µs/div and slower time-base settings
• Temperature-dependent reduction: 2.5 MHz per °C above +35°C
**Sampling & Memory**
• Maximum real-time sampling: 400 MSa/s per channel
• Real-time record length: 2001 points
• Repetitive record length: 501 points
**Vertical System**
• Sensitivity: 2 mV/div to 5 V/div (8-bit, 10-bit via HP-IB with averaging)
• Input impedance: 1 MΩ, switchable
• Coupling: DC or AC
• Vertical gain accuracy: ±0.08% per °C from calibration temperature
**Timebase & Triggering**
• Time/division: 1 ns/div to 5 s/div
• Internal trigger: DC to 100 MHz coupling; 100–400 MHz sensitivity
• External trigger: DC to 250 MHz, down to 1.75 ns glitch detection
• Advanced triggering: Edge, pattern, state, delayed, and glitch modes
**Measurements & Interface**
• 16 automatic pulse parameter measurements
• HP-IB (IEEE 488.2) programmability and waveform data access
**Power & Environment**
• Input: 115/230 VAC (-25% to +15%), 48–66 Hz
• Power consumption: 350 VA maximum
• Operating temperature: ±10°C from calibration temperature (8+ averages required)
## Key Features
• Dual simultaneous channels for multi-signal comparison
• High real-time sampling rate supports fast transient capture
• Switchable input impedance and AC/DC coupling for flexible signal conditioning
• Advanced logic triggering with sub-nanosecond glitch detection
• Direct waveform access via HP-IB for automated test systems
## Typical Applications
• Design verification of high-speed digital and analog circuits
• Manufacturing test and quality assurance
• Signal integrity analysis in laboratory environments
• Single-shot pulse and transient characterization
## Compatibility & Integration
HP-IB (IEEE 488.2) interface enables integration into automated test environments and remote instrument control.
