The HP/Agilent 54710D is a modular oscilloscope engineered for high-speed signal acquisition and deep-memory waveform analysis at 4 GSa/s. Built for applications requiring detailed examination of complex signals over extended capture windows, this instrument excels in digital communication testing, power electronics, and automotive diagnostics. Its modular architecture enables flexible channel configuration while deep memory capability supports capture and analysis of long-duration signals and transient events.
## Technical Specifications
• **Sample Rate:** 4 GSa/s
• **Vertical Resolution:** 7 bits (1 part in 128); extendable to approximately 10 bits with magnification and averaging
• **Memory Depth:** Deep memory capability with effective depth of millions of bytes through random repetitive sampling
• **Time Base Post-Trigger:** Up to +1 second or +10 divisions (whichever is greater)
• **Time Base Adjustment Resolution:** 10 ps or 10× delay setting (whichever is greater)
• **Power Supply:** 115/230 V AC, −25% to +15%, 48–66 Hz; 350 W maximum consumption, 650 VA maximum
• **Operating Temperature:** 0°C to +55°C
• **Operating Humidity:** Up to 90% relative humidity at +40°C
• **Operating Altitude:** Up to 4600 m (15,000 ft)
## Key Features
• Edge and logical pattern triggering on all sources with independent level settings
• Events-delayed mode: triggers on the nth edge (n = 1 to 10⁶ − 1) at maximum event rates to 150 MHz
• Time-delayed triggering: 20 ns to 5 seconds post-arming edge
• Random repetitive sampling for capture of rare narrow waveforms
• Six independent waveform memories with color-differentiated display of stored versus live data
• HP-IB (IEEE 488) programmable interface for remote control and data transfer
## Typical Applications
Digital communication signal verification, power electronics characterization, and automotive diagnostic testing requiring extended observation windows and high time-resolution capture.
## Compatibility & Integration
HP-IB (IEEE 488) command interface enables automated test sequences and integration into measurement systems.
