The HP/Agilent 6267B is a 0–40 VDC, 0–10 ADC power supply delivering up to 400 W for laboratory and production test environments. It combines a transistor series regulator with a triac preregulator to achieve high efficiency, excellent line and load regulation, and minimal ripple and noise. The unit operates in constant voltage or constant current mode with automatic crossover, making it suitable for powering devices across a wide range of impedance profiles.
Technical Specifications
Output Voltage: 0–40 VDC, adjustable via front panel or remote programming. Ten-turn control option available for enhanced resolution. Rear panel access to voltage programming coefficient and zero output adjustment.
Output Current: 0–10 ADC with three-digit graduated decadial control and optional ten-turn adjustment for improved resolution. Automatic constant current crossover when load current reaches the set limit.
Power Output: 400 W maximum.
Line Regulation (104–127 VAC or 208–254 VAC input):
• Constant Voltage: <0.01% + 200 µV
• Constant Current: <0.02% + 500 µA
Load Regulation:
• Constant Voltage: <0.01% + 200 µV per °C after 30-minute warmup
• Constant Current: <0.03% + 3 mA rms
Ripple and Noise (20 Hz–20 MHz, constant voltage mode): <200 µV rms or 10 mV peak-to-peak.
Protection: Built-in overvoltage crowbar with operator-adjustable limits. Fully rated for continuous short-circuit conditions.
Metering: Dual analog panel meters for voltage and current.
Interface: Remote programming via external resistance or control voltage with rear panel barrier strip connections. Remote error sensing capability.
Cooling: Convection cooled.
Physical: 5¼-inch height, full-rack width cabinet.
– Key Features
• Automatic CV/CC mode switching with zero crossover distortion
• High regulation accuracy suitable for precision component testing
• Low noise performance for sensitive analog circuits
• Operator and remote control options
• Continuous short-circuit protection
– Typical Applications
Component characterization, circuit board assembly and burn-in testing, laboratory benchtop measurement, rack-mounted automated test systems.
