The HP/Agilent 81680B Tunable Laser Source delivers precision optical testing across the 1460 nm to 1580 nm band with mode-hop-free tuning, dual output ports, and exceptional wavelength stability. It is engineered for optical component characterization, DWDM system validation, and optical amplifier analysis where wavelength accuracy and spectral purity are critical.
Technical Specifications
Wavelength Performance
• Wavelength range: 1460 nm to 1580 nm
• Wavelength resolution: 0.1 pm (12.5 MHz at 1550 nm)
• Absolute wavelength accuracy: ± 0.01 nm
• Relative wavelength accuracy: ± 5 pm (typical)
• Wavelength repeatability: ± 1 pm (typical)
• Wavelength stability: ≤ ± 1 pm over 24 hours at constant temperature (typical)
• Spectral linewidth (coherent control off): 100 kHz
• Spectral linewidth (coherent control on): > 50 MHz typical across 1460–1580 nm
Output Power
• Output 1 (ultra-low SSE): −6 dBm (1520–1570 nm), −13 dBm (1460–1580 nm)
• Output 2 (high power): +5 dBm (1520–1570 nm), −3 dBm (1460–1580 nm)
• Optical power stability: ± 0.01 dB over 1 hour, ± 0.03 dB over 24 hours (typical)
• Power repeatability: ± 0.01 dB (typical)
• Power flatness vs. wavelength: ± 0.2 dB (typical)
Emission Quality
• Signal-to-spontaneous emission ratio: ≥ 63 dB/nm (1520–1570 nm), ≥ 53 dB/nm (1460–1580 nm)
• Side-mode suppression ratio: ≥ 40 dBc typical (1480–1580 nm)
Tuning & Control
• Maximum tuning speed: 80 nm/s
• Step tuning: 400–600 ms per 0.1 nm step
• Built-in optical attenuator: standard (Option 003, 60 dB range)
– Key Features
• Dual-output architecture: low-SSE port for precision measurements; high-power port for system-level testing
• Mode-hop-free tuning across full 120 nm range ensures continuous operation without spectral discontinuities
• Polarization-maintaining Panda-type fiber outputs for stable state-of-polarization
• ± 0.01 pm wavelength repeatability enables repeatable, traceable calibration
– Typical Applications
• Optical amplifier gain and noise figure characterization
• DWDM component and subsystem testing
• Optical filter and multiplex device validation
• Wavelength-dependent loss and dispersion measurement
• Optical network simulation and channel emulation
