The HP/Agilent 83732B is a synthesized signal generator delivering precision RF and microwave signal generation across 10 MHz to 20 GHz. Built for component testing, system simulation, and automated test environments, it combines broad frequency coverage with exceptional spectral purity and stable frequency control. The instrument achieves typical output power exceeding +14 dBm with 1 kHz frequency resolution and ±0.01 ppm accuracy, making it suitable for demanding laboratory and production applications.
## Technical Specifications
**Frequency Performance**
• Frequency range: 10 MHz to 20 GHz
• Frequency resolution: 1 kHz standard; 1 Hz with Option 1E8
• Frequency accuracy: ±0.01 ppm
• Frequency stability: ±1 × 10⁻⁸
• Frequency switching: <50 ms to within 1 kHz (any step); <35 ms for <1 GHz steps
**Output Power**
• Maximum leveled output: +13 dBm (0.01–1 GHz); +11 dBm (1–18 GHz standard); +10 dBm (18–20 GHz standard)
• Minimum leveled output: –4 dBm; –110 dBm with Option 1E1
• Output resolution: 0.01 dB
• Output impedance: 50 ohms
• Output SWR: <2.0:1 nominal
• Power accuracy: ±1.0 dB (50 MHz to 20 GHz)
**Spectral Purity**
• Harmonics: <–55 dBc (at 3 kHz): –60 dBc
• SSB phase noise: –115 dBc/Hz to –65 dBc/Hz depending on offset frequency and carrier
**Stability Options**
• High-stability timebase (Option 1E5): Aging <1.5 × 10⁻⁹/day; temperature effects <1 × 10⁻⁷ over 0–55°C
• Standard timebase: Aging <1.0 × 10⁻⁸/day after 72 hours at 25°C ±10°C
## Key Features
• Synthesized architecture ensures signal stability and accuracy
• User level correction for leveled power delivery at remote test ports
• 50-ohm matched output with 2:1 SWR rating
• Settable power resolution to 0.01 dB
## Typical Applications
• RF and microwave component characterization
• System-level signal simulation and stimulus
• Production and R&D test automation
• Frequency and power sweep measurements
## Compatibility & Integration
Optional timebase upgrades and external 10 MHz reference capability support integration with synchronized multi-instrument test systems.
