The JDS Uniphase MAP+2M00 is a 19-inch, 8-slot master chassis engineered for optical and electro-optical test and measurement applications. Built on a fully modular architecture, it serves as the control hub within the Multiple Application Platform (MAP) series, supporting hot-swappable instrumentation cassettes without system shutdown. The chassis accommodates up to eight single-width cassettes and scales to sixty-four total slots when configured with up to seven MAP+2S00 slave chassis in a master-slave topology.
## Technical Specifications
• **Form Factor:** 19-inch rackmountable chassis with 8 slots for single-width cassettes
• **Architecture:** Fully modular design with common hot-swappable backplane
• **Hot-Swappable Operation:** Cassettes insert and remove without power cycle
• **Field-Replaceable Modules:** Main controller, power supply, keypad/display module, and remote interface module
• **User Interface:** 9-key keypad with color display
• **Connectivity:** RS-232 and GPIB interfaces for remote control and data acquisition
• **Protection:** Fast-blow fuses rated at 250 V, 6.3 A
• **Compliance:** CE, UL61010A-1, CAN/CSA-C22.2 No.1010.1
• **Mechanical:** Front and rear handles for rack mounting; tilting feet for benchtop operation
## Key Features
• Expandable to 64 single-width cassettes via master-slave configuration
• Field-replaceable main components minimize service downtime
• Integrated 9-key keypad and color display for direct system control
• Dual interface support (RS-232 and GPIB) for integration into automated test environments
## Typical Applications
• Optical test and measurement systems requiring modular, scalable instrumentation
• Multi-module test configurations with centralized control
• Rack-integrated measurement platforms for production and laboratory environments
## Compatibility & Integration
• Accepts over 15 different JDS Uniphase MAP series instrumentation cassettes
• Functions as master controller for MAP+2S00 slave chassis
• Compatible with MAP Console software for unified system control and data management
