The JDS Uniphase MAPS+1W731A1FP is a hot-swappable instrument cassette designed for integration within the Multiple Application Platform (MAP) series. The MAP platform delivers modular, field-configurable optical test and measurement capability through a dynamic architecture that automatically identifies and supports installed cassettes. Engineers can assemble custom instrument configurations by selecting from a library of optical modules, eliminating the need for multiple dedicated benchtop units.
## Technical Specifications
**Platform Architecture**
• Modular, hot-swappable cassette system with dynamic firmware identification
• Two chassis formats: 19-inch 8-slot Master (MAP+2M00) and 9.5-inch 3-slot Benchtop (MAP+2B00)
**Environmental & Operating Parameters**
• Operating Temperature: 0 to 50 °C
• Storage Temperature: -30 to 60 °C
• Humidity: Less than 80% RH, non-condensing (0 to 40 °C)
**Interfaces & Display**
• RS-232, GPIB, USB Keyboard support (configuration-dependent)
• Color LCD display (VGA resolution)
• Standard AC power input
**Physical Specifications — MAP+2M00 Master**
• Dimensions: 44.91 × 13.24 × 52.37 cm (3U, 19-inch width)
• Weight: 14.3 kg
**Physical Specifications — MAP+2B00 Benchtop**
• Dimensions: 22.5 × 14.8 × 43.0 cm (3U, 1/2 19-inch width)
• Weight: 8.6 kg
## Key Features
• Hot-swappable instrument cassettes enable field reconfiguration without chassis replacement
• Automatic cassette detection and firmware adaptation
• Supports optical switches (1×2, 2×2, 1×4, 2x1x12 configurations)
• Compatible with tunable laser sources (C-band and C+L-band)
• Integrates EDFAs with output power to 21 dBm and low noise figure
• Modulation modules rated to 1 GHz bandwidth
• Attenuators and ASE sources with wide wavelength coverage
## Typical Applications
• DWDM channel characterization and testing
• Optical amplifier performance validation
• Bit error rate (BER) measurements
• CATV receiver testing
• Developmental optical subsystem evaluation
## Compatibility & Integration
The cassette integrates within the MAP platform family alongside optical switches, tunable laser sources, amplifiers, attenuators, light sources, and modulation modules. All compatible modules share the same mechanical and electrical interface, permitting rapid system reconfiguration to match evolving test requirements.
