The JDS Uniphase MAPS+2W731W1FP is a hot-swappable optical test module designed for the Multiple Application Platform System (MAPS). This cassette-based instrument integrates into either the 19-inch 8-slot Master chassis (MAP+2M00) or the 9.5-inch 3-slot Benchtop chassis (MAP+2B00), enabling flexible configuration for diverse optical characterization tasks. Module installation and removal occur without system power-down, supporting continuous operation in laboratory and enterprise test environments.
## Technical Specifications
• **Platform Compatibility:** JDS Uniphase MAPS architecture
• **Chassis Options:** 19-inch rackmountable Master (8-slot) or 9.5-inch Benchtop (3-slot) configurations
• **Hot-Swap Capability:** Module exchanges without operational interruption
• **Control Interfaces:** RS-232 and GPIB remote control
• **Software Environment:** ActiveX console with simulation mode and device drivers
• **Firmware:** Automatic cassette identification upon installation
• **Operating Temperature:** 0 to 50 °C
• **Storage Temperature:** -30 to 60 °C
• **Humidity:** < 80% RH (0 to 40 °C, non-condensing)
## Key Features
• Modular cassette design for rapid system reconfiguration
• Automatic module detection simplifies setup and integration
• Remote command control via industry-standard interfaces
• Operates across optical test and measurement wavelength ranges common to the MAPS platform
## Typical Applications
• Optical component and system characterization
• DWDM channel testing and analysis
• Optical amplifier performance evaluation
• Bit error rate (BER) measurement
• Signal routing verification in optical networks
## Compatibility & Integration
The MAPS+2W731W1FP functions within the complete JDS Uniphase MAPS ecosystem. It operates in both Master and Benchtop chassis variants, utilizing common firmware and control software. Standard ActiveX drivers enable integration with custom measurement applications and third-party test automation frameworks.
