The JDS Uniphase MTA300 is a programmable optical attenuator cassette designed for integration into the MTA Series Attenuator Shelf. It delivers precise, adjustable attenuation of optical signals across C-band and L-band wavelengths, making it essential for DWDM power equalization, transmission equipment testing, and optical system validation. The module operates as part of a modular, rack-mountable multi-channel system supporting up to eight cassettes in a single 19-inch chassis.
## Technical Specifications
• **Attenuation Range:** >60 dB programmable
• **Resolution:** 0.5 dB
• **Accuracy:** ±0.1 dB nominal
• **Wavelength Range:** 1200 nm to 1700 nm (optimal: 1545 nm to 1645 nm)
• **Fiber Type:** Singlemode (9/125 µm)
• **Connector Options:** FC/PC, SC/APC
• **Power Supply:** 100 V to 240 V AC, 50 Hz to 60 Hz
• **Power Consumption:** 80 VA maximum
• **Fuse:** (5×20) mm, T1A/250 V (slow-acting)
## Key Features
• Etalon-free optical design minimizes signal distortion
• Low polarization dependent loss (PDL)
• High return loss performance
• Bidirectional optics—either fiber port functions as input
• Integrated beam blocking switch for rapid attenuation to infinite loss, simulating fiber failure conditions
• Retractable connector plate for maintenance and cleaning access
• IEEE 488.2 (GPIB) remote control with SCPI command compatibility
• LabVIEW drivers included for automated system control
• Front panel keypad and display on controller cassette
## Typical Applications
• Power equalization in Dense Wavelength Division Multiplexing (DWDM) systems
• Production testing and validation of optical transmission equipment
• Optical communication system calibration and characterization
## Compatibility & Integration
The MTA300 operates within the MTA Series framework. Standard configurations pair the cassette with an MTA100 AC-powered chassis and MTA150 GPIB controller, accommodating up to eight attenuator modules in a single shelf. This modular architecture enables custom multi-channel configurations optimized for specific test requirements.
