The JDS Uniphase TB9226-FA is a tunable grating filter engineered for precise wavelength selection across the S + C bands (1460–1575 nm). It delivers narrow-bandwidth optical filtering with grating-based rejection suitable for laboratory and production test environments where signal conditioning and wavelength selectivity are critical.
This filter excels at ASE suppression in EDFA systems and removing spontaneous emissions from DFB and tunable laser sources during component characterization. Wavelength tuning resolves to 0.01 nm with 0.2 nm setting accuracy and 0.05 nm repeatability. Narrow passband performance—0.25 nm at −3 dB (FWHM) and 0.7 nm at −20 dB—enables high spectral purity across the tuning range.
Technical Specifications
• Wavelength Tuning Range: 1460–1575 nm
• Bandwidth (−3 dB FWHM): 0.25 nm typical (as low as 0.22 nm)
• Bandwidth (−20 dB): 0.7 nm typical
• Insertion Loss: ≤6.0 dB
• Polarization Dependent Loss (PDL): ≤0.2 dB
• Return Loss: >45 dB
• Wavelength Resolution: 0.01 nm
• Wavelength Setting Accuracy: 0.2 nm
• Repeatability: 0.05 nm
• Optical Connectors: FC/APC (SMF in/out; FC/PC available on request)
• Input Power: 100–240 V AC, 50–60 Hz
• Power Consumption: 80 VA maximum
• Dimensions: 21.2 cm W × 8.9 cm H × 35.5 cm D (19 in rack mount, 2U, 1/2 rack width)
• Weight: 4 kg
• Operating Temperature: 10–40 °C
• Storage Temperature: 0–50 °C
– Key Features
• Dual control via front-panel keypad and remote interfaces (GPIB/IEEE 488, RS-232)
• Tunable grating mechanism for flexible wavelength selection across 115 nm span
• Sub-0.25 nm passband width minimizes adjacent-channel interference
• High return loss and low PDL ensure stable performance in cascade configurations
– Typical Applications
• ASE filtering in EDFA chains
• Spontaneous emission suppression from DFB and tunable laser sources
• Wavelength-selective component testing
• WDM and DWDM system validation
– Compatibility & Integration
Standard FC/APC bulkheads interface with single-mode fiber systems. GPIB and RS-232 remote control enable integration into automated test benches and instrument control frameworks.
