The JDSU MAPL-2T1FA is a tunable laser source module for optical testing and measurement across the C+L band. Built on the JDSU Multiple Application Platform (MAP) architecture, it delivers continuously tunable output with high wavelength accuracy and stability, making it suited for component characterization, insertion loss testing, and dispersion penalty analysis. The module integrates into the MAP-200 platform for density and configurability in laboratory and manufacturing environments.
## Technical Specifications
• **Wavelength Range:** 1518 nm to 1637 nm
• **Output Power:** -15 dBm minimum
• **Tuning:** Continuous across specified wavelength range
• **Wavelength Accuracy & Stability:** Specified as key performance parameters
• **Linewidth:** Narrow linewidth for precise optical characterization
## Key Features
• Continuously tunable across C+L band wavelengths
• High wavelength accuracy and stability for repeatable measurements
• Narrow linewidth optimized for optical component testing
• Modular MAP architecture for flexible test system configuration
• LXI-compliant platform integration with Ethernet connectivity and IVI driver support
## Typical Applications
• Optical component and system characterization
• Insertion loss and dispersion penalty testing
• Optical transmission network element development
• Manufacturing test and validation
• Research and design phase optical measurements
## Compatibility & Integration
The MAPL-2T1FA integrates into the JDSU MAP-200 mainframe platform, enabling module sharing and modularity across multi-function test systems. LXI compliance ensures direct integration with Ethernet-based automated test environments and standard IVI driver compatibility.
