The Keithley 213 Quad Voltage Source is a programmable four-channel voltage source designed for automated testing, device biasing, and semiconductor characterization. Each independent channel delivers up to ±10V at 10mA output current, with three selectable ranges (±1V, ±5V, ±10V) and autoranging capability. GPIB control enables integration into multi-instrument test systems alongside Source-Measure Units and precision measurement equipment.
## Technical Specifications
**Voltage Output**
• Ranges: ±1V, ±5V, ±10V (programmable or autoranging)
• Resolution: 250µV (±1V), 1.25mV (±5V), 2.5mV (±10V)
• Accuracy (18°–28°C, 1mA): ±(0.05% of setting + 1mV) @ ±1V; ±(0.05% of setting + 3mV) @ ±5V; ±(0.05% of setting + 10mV) @ ±10V
• Temperature coefficient: ±(0.002% of setting + 100µV)/°C across 0°–18°C and 28°–50°C
• Output resistance: <500mΩ typical
• Settling time: 750µs to rated accuracy (1kΩ load, typical)
• Wideband noise (0.1–20MHz): 8mV p-p typical
• Low-frequency noise (0.1–300Hz): 150µV + 50ppm range p-p
**Waveform Generation**
• Internal 8192-location buffer with 1ms minimum step time
• Four control modes: user-defined, indirect, stepped, buffer-controlled
• Port synchronization for simultaneous waveform execution
**Digital I/O**
• 8-bit TTL-compatible inputs (level sensitive)
• 8-bit outputs: selectable TTL or open collector with 100mA drive; 50V withstand for relay driving
• DB25 female connector
**Interfaces & Control**
• IEEE-488 GPIB bus control
• External trigger via GPIB or rear DB-25 connector; TTL BNC trigger I/O
**Electrical**
• Power: 90–125 VAC or 180–250 VAC (internally selectable), 50–60Hz, 70VA maximum
• Isolation: 500V between ports; 500V or 105V·Hz maximum (whichever is less); 250V rms common-mode (DC to 60Hz)
**Physical**
• Dimensions: 425mm W × 45mm H × 309mm D
• Weight: 3.52 kg
• Rear panel 12-pin quick-disconnect analog connector
## Key Features
• Four independent, stackable channels
• Three voltage ranges with autoranging
• Fast settling (750µs typical)
• Low output noise (8mV wideband, 5mV 0.1–300kHz)
• Waveform buffering for complex bias sequences
• High-voltage digital output capability (50V relay drive)
• High port isolation (500V)
## Typical Applications
• Multi-pin device biasing in production test
• Semiconductor parameter characterization
• Complementary biasing for SMU-based measurement systems
• Waveform-based stress testing and burn-in
## Compatibility & Integration
GPIB control integrates directly with automated test systems. External triggering via IEEE-488 or panel connectors enables synchronization with other instruments. TTL digital I/O ports support relay and logic control from external supplies.
