The Advantest R6145 is a programmable DC voltage generator engineered for precision bias supply and device characterization in semiconductor and electronic component testing. It delivers stable, low-noise output across laboratory and production environments with voltage resolution down to 10 µV and current control spanning 100 nA to 1 A in pulse mode.
Technical Specifications
Output Ranges
• DC Voltage: 10 µV to 60 V with 10 µV step (minimum range) and 1 mV step (maximum range)
• DC Current: 100 nA to 1 A pulse mode with 100 nA resolution (minimum range) and 100 µA step (maximum range)
• Maximum Output Power: 10 W
• Output Configuration: Bipolar, floating, and guarded; front binding posts for Hi output, Hi sense, Lo output, Lo sense, and Guard
Output Modes and Timing
• DC output modes: spot, linear sweep, random sweep
• Pulse output: single spot, linear sweep, random sweep
• Pulse Width: 1 to 1000 ms programmable
• Pulse Cycle: 2 to 1000 ms or 1 to 30000 s
• Minimum Pulse Width: 1 ms
Current and Voltage Limiting
• Current Limiter: 1 mA to 300 mA range
• Voltage Limiter: 10 mV to 60 V range
Performance Metrics
• Voltage Noise/Ripple: 3 mVp-p (SLOW mode)
• Line Regulation: Specified at 100 VAC ± 10%
• Load Regulation: Specified at maximum load per range with 4-wire connection
• Temperature Coefficient and Linearity: Characterized at 23°C
– Key Features
• Memory storage for up to 500 settings points
• Programmable sweep of 16 patterns with linear or random modes
• Adjustable control loop time constant for overshoot damping
• IEEE 488-1978 GPIB interface (SH1, AH1, T6, L4, SR1, RL1, PP0, DC1, DT1, C0, E2)
• 16-bit digital output for internal status or setting readback (5 V pull-up, 10 kΩ open-collector)
• TTL-level trigger input and output for measurement synchronization and sweep control
• Trigger Link for dual-unit synchronization with R6245/R6246 series
• Scanner control integration for R7210 and compatible models
– Typical Applications
• DC bias supply for semiconductor device characterization
• Parametric testing of analog and mixed-signal components
• Low-voltage, high-resolution test environments requiring sub-millivolt accuracy
– Compatibility & Integration
The R6145 interfaces via GPIB for remote control and integrates with measurement instruments through TTL-level trigger signals. Synchronization support enables multi-unit configurations for advanced test sequences.
