The Keithley 2260B-250-4 is a programmable DC power supply engineered for precision voltage and current control across demanding test and measurement applications. Delivering 250V at 4.5A with 360W maximum output, it combines front-panel operation with full remote control via GPIB, USB, and Ethernet interfaces. The unit excels in semiconductor testing, component characterization, and general-purpose power sourcing where accuracy and stability are critical.
Technical Specifications
Output Voltage: 0V to 250V, 10mV resolution, ±0.2% of reading + 50mV accuracy, programmable to ±0.1% of setting.
Output Current: 0A to 4.5A, 1mA resolution, ±0.2% of reading + 2mA accuracy, programmable to ±0.1% of setting.
Output Power: 360W maximum. Overvoltage protection adjustable to 260V ±5%, overcurrent protection to 4.8A ±5%, and overpower protection at 360W ±5%.
Stability & Transients: Voltage ripple and noise rated below 1mVrms (20Hz to 20MHz bandwidth) with less than 5mVp-p. Transient recovery time below 500µs to within 1% of setting across 50% to 100% load steps. Load regulation maintains voltage stability below 0.05% across full load range and current below 0.1%. Line regulation remains below 0.01% voltage and 0.05% current for ±10% input variation.
Long-Term Accuracy: Output stability below 0.05% per hour for voltage and 0.1% per hour for current after 30 minutes warm-up. Temperature coefficient ranges from 0.02% per °C (voltage) to 0.05% per °C (current).
– Key Features
• Remote sense terminals for voltage drop compensation
• Analog programming inputs selectable between 0-5Vdc or 0-10Vdc
• Front-panel numeric keypad and rotary encoder knob for direct control
• Forced air cooling with standard 19-inch rack mounting capability
• Compact 3U form factor: 133mm H × 430mm W × 421mm D, 13kg weight
– Typical Applications
Semiconductor device testing, component characterization, automated test system integration, laboratory power sourcing.
– Compatibility & Integration
GPIB (IEEE-488), USB 2.0, and Ethernet (10/100 Base-T) interfaces enable integration into multi-instrument test systems and remote operation environments.
