The Keithley 2651A High Power System SourceMeter is a single-channel precision instrument that combines power supply, true current source, digital multimeter, arbitrary waveform generator, and electronic load functionality. It delivers up to 202 W DC and 2000 W pulsed power across a four-quadrant source/sink architecture, making it ideal for characterizing high-brightness LEDs, power semiconductors, DC-DC converters, batteries, and high-power components.
Technical Specifications
DC Power Output
• Maximum output power: 202 W
• Four-quadrant capabilities: ±10.1 V at ±20.0 A, ±20.2 V at ±10.0 A, ±40.4 V at ±5.0 A
• Current source/sink: ±5.05 A at ±40 V, ±10.1 A at ±20 V, ±20.2 A at ±10 V
• Quadrant II and IV power envelope: 36 V, 4.5 A
Pulsed Power
• Maximum pulsed power: 2000 W
• Pulsed voltage/current: ±40 V, ±50 A
• Pulse width: 100 µs to DC, 1 µs resolution, ±5 µs accuracy, 2 µs jitter (typical)
• Duty cycle range: 1% to 100%
Voltage Measurement
• Range: ±40 V
• Resolution: 100 nV
• Accuracy (1 year, 23°C ±5°C): ±(0.025% reading + 50 µV) for 20 V range
• Overshoot (typical): <±(0.1% + 10 mV)
• Settling time: <50 µs (best range)
Current Measurement
• Range: ±50 A (pulsed), ±20.2 A (DC)
• Resolution: 100 fA
• Accuracy (1 year, 23°C ±5°C): ±(0.05% reading + 2 nA) for 1 mA range
• Overshoot (typical): <±0.1%
• Settling time: <80 µs (best range)
Digitization
• Dual digitizers with 18-bit resolution for digitizing mode
• Sampling rate: Up to 1 MHz (1 µs per point)
• Digitizing mode: 1,000,000 readings/second
• Integrating mode: 22-bit A/D converter
– Key Features
• Single-unit integration eliminates test rack complexity
• Transient characterization via 1 µs sampling resolution
• Wide dynamic range for high-current and high-power testing
• Digitizing and integrating measurement modes for diverse test profiles
– Typical Applications
• High-brightness LED characterization
• Power semiconductor device testing
• Battery and cell characterization
• DC-DC converter validation
• Materials and component reliability assessment
• R&D, reliability, and production test environments
