The Keithley 3402-R is a dual-channel pulse and pattern generator that produces complex digital signals for circuit characterization, semiconductor testing, and digital system verification. Each channel operates independently, enabling simultaneous generation of complementary or distinct waveforms across four operating modes: Pulse, Burst, Pattern, and External Width. The instrument delivers programmable control over amplitude, rise time, fall time, pulse width, and duty cycle, supporting pattern generation from 2 bits to 16 kbits with selectable NRZ and RZ formats. PRBS sequences range from 2⁵-1 to 2¹⁴-1, accommodating both user-defined and preset patterns for serial data simulation.
Technical Specifications
Frequency & Timing
• Frequency range: 1 mHz to 165 MHz
• Period: 6.06 ns to 1000 seconds
• Period accuracy (PLL): ±0.01%; (VCO): ±0.5% typical with self-calibration, ±3% without
• Period resolution (PLL): 4 digits, 1 ps best case; (VCO): 3.5 digits, 10 ps best case
• Period jitter (RMS): VCO 0.015% + 20 ps; PLL 0.001% + 15 ps
Pulse Parameters
• Pulse width: 3.02 ns to (period – 3.02 ns)
• Pulse width accuracy: ±0.5% ± 250 ps typical with self-calibration; ±3% ± 250 ps without
• Pulse delay: 0 to (period – 3.02 ns)
• Pulse delay accuracy: ±0.5% ± 0.5 ns typical; ±3% ± 0.5 ns without self-calibration
• Delay and width resolution: 3.5 digits, 20 ps best case
• Delay and width jitter (RMS): 0.01% + 15 ps
• Fixed delay: 22 ns
• Rise/Fall time: Adjustable 2.5 ns to 200 ms minimum; 2.5 ns maximum at 10 V p-p; 2.3 ns typical at 5 V p-p; 2.1 ns typical at 2 V p-p
• Rise/Fall time accuracy: ±10% ± 200 ps
– Key Features
• Dual-channel architecture for simultaneous complex waveform generation
• Four operating modes accommodate single pulses, burst sequences, programmable patterns, and external-triggered width modulation
• Pattern library supports PRBS and user-defined sequences up to 16 kbits
• Selectable NRZ and RZ encoding formats
• PLL and VCO timing engines with sub-picosecond resolution
– Typical Applications
• Research and development of digital communication systems
• Semiconductor device and circuit characterization
• Digital protocol simulation and verification
• Serial data pattern generation and testing
