The Keysight (Agilent) E2615A is a 0.65 mm wedge probe adapter engineered for direct access to signals on Thin Quad Flat Pack (TQFP) and Plastic Quad Flat Pack (PQFP) surface-mount integrated circuits. This mechanically non-invasive contact solution eliminates the risk of pin shorts and component damage inherent to traditional soldering approaches, delivering reliable signal acquisition for test and measurement workflows.
Technical Specifications
• Pitch spacing: 0.65 mm
• Contact configuration: 3-signal adapter
• Operating voltage: less than 40 V DC + peak AC
• Maximum operating current: 0.5 A
• Contact resistance: less than 0.1 Ω
• Capacitance between contacts: 2 pF (typical)
• Self-inductance: 15 nH (typical)
– Key Features
The adapter establishes dual contact points on each IC leg, enhancing electrical reliability and signal integrity. Low parasitic inductance (15 nH typical) and minimal inter-contact capacitance (2 pF typical) preserve signal fidelity across measurement bandwidth. Sub-0.1 Ω contact resistance ensures minimal voltage drop and repeatable measurements.
Wedge probe geometry allows non-destructive engagement with fine-pitch package leads. The mechanical design accommodates both TQFP and PQFP device families without modification.
– Typical Applications
In-circuit signal probing on surface-mount devices during functional test, debug, and validation. Suitable for applications requiring safe, repeatable access to high-density IC pins without solder connections or permanent fixture modifications.
– Compatibility & Integration
Designed for integration with Keysight 10070-series probes. Compatible with TQFP and PQFP package styles. Reference Keysight documentation: *Wedge and IC Clips for Surface Mount Probing with Keysight 10070-series Probes* and *Keysight Wedge Probe Adapters User’s Guide (E2613-92008)*.
