The Keysight (Agilent) E5061A ENA-L Network Analyzer delivers vector network analysis across 300 kHz to 1.5 GHz for RF component characterization in development, manufacturing, and education settings. This instrument provides S-parameter measurements with 115 to 120 dB dynamic range and trace noise as low as 0.005 dB rms magnitude. It supports multiple sweep types—linear, log, segment, and power—enabling accurate measurement of passive and active devices. The analyzer accommodates both 50 ohm and 75 ohm port impedances with +10 dBm maximum test port input and +20 dBm damage level.
Technical Specifications
Frequency Range: 300 kHz to 1.5 GHz
Dynamic Range: 115 dB to 120 dB
Trace Noise: 0.005 dB rms (magnitude); 8 mdB rms (phase, 300 kHz to 1 MHz)
Output Power: –5 dBm to +10 dBm standard; –45 dBm to +10 dBm with Option E5061A-1E1 or integrated options 250/275
IF Bandwidth: 10 Hz to 30 kHz, with nominal settings at 10, 30, 100, 300 Hz, 1 kHz, 3 kHz, and 30 kHz
Level Accuracy: ±0.8 dB at 0 dBm, 50 MHz absolute (300 kHz to 3 GHz)
Level Linearity: ±0.75 dB at –5 to +10 dBm (300 kHz to 3 GHz)
Magnitude Stability: 0.01 dB/°C (3 MHz to 3 GHz)
Phase Stability: 0.1°/°C (3 MHz to 3 GHz)
Crosstalk: –110 dB (300 kHz to 3 GHz)
Test Port Impedance: 50 ohm or 75 ohm
Maximum Test Port Input: +10 dBm; damage level +20 dBm, ±30 VDC
Power Requirements: 47–63 Hz, 90–132 VAC or 198–264 VAC (auto-switched); maximum 350 VA consumption
– Key Features
• Integrated T/R or S-parameter test set
• Four independent measurement channels with individual settings and trace comparison
• Segment sweep capability for targeted frequency interval analysis
• Extended dynamic power range option for low-level measurements
• 10.4-inch color LCD display (Option E5061A-015) with optional touch screen (Option E5061A-016)
– Measurement Capabilities
• S-parameter measurements
• Fault location analysis (Option E5061A-100)
• Structural return loss analysis (Option E5061A-100)
– Typical Applications
Filter and cable characterization; amplifier and active component evaluation; passive component testing; impedance and reflection coefficient analysis across RF frequency bands.
