The Keysight E8362A is a 20 GHz PNA Series Network Analyzer engineered for high-precision characterization of RF and microwave devices across 45 MHz to 20 GHz. This four-receiver instrument delivers dynamic range up to 138 dB with direct receiver access and supports 16 independent measurement channels, enabling rapid S-parameter acquisition at sweep speeds below 26 µs/point. Advanced calibration techniques including TRL/LRM are supported for waveguide, on-wafer, and in-fixture measurements.
Technical Specifications
• Frequency range: 45 MHz to 20 GHz
• Dynamic range: 123 dB at test port; 138 dB with direct receiver access (option 014)
• IF bandwidth: 1 Hz to 40 kHz nominal; system IF bandwidth 10 Hz for corrected performance
• Output power: 10 dBm
• Measurement channels: 16 independent
• Sweep speed: <26 µs/point
• RF connectors: 3.5 mm (male), 50 Ω
• Display: High-resolution color touch screen LCD with integrated help
• Storage: Built-in hard drive
• Operating temperature: 0 to +40 °C
• Storage temperature: -40 to +70 °C
• Dimensions: 24 × 20 × 16 inches
• Weight: 50 lbs (29 kg); shipping weight 64 lbs (36 kg)
• Power supply: Auto-switching 100–120 V / 220–240 V, 50/60/400 Hz
– Key Features
• Four-receiver architecture enables extended dynamic range configurations
• TRL/LRM calibration support for complex device geometries
• Impedance and time-domain analysis capabilities
• Frequency-dependent dynamic range optimization from 45 MHz through 20 GHz
• Direct receiver access architecture for low-loss measurement configurations
– Typical Applications
• RF and microwave component characterization (amplifiers, filters, antennas)
• Wireless communication device testing
• Aerospace and defense applications
• On-wafer and in-fixture device measurements
• Research and development in RF/microwave engineering
– Compatibility & Integration
The E8362A accepts 3.5 mm connectors and integrates optional bias-tee and extended power range configurations. Extended dynamic range (option 014) and extended power range with bias-tees (option UNL) are available for specialized measurement requirements.
