The Keysight (Agilent) E5501A Phase Noise Measurement Solution characterizes phase noise across 50 kHz to 1.6 GHz with rapid, accurate measurements suitable for ATE systems and R&D benchtop applications. It delivers sensitivity and employs phase detector techniques—reference-source/PLL or frequency-discriminator methods with analog delay line—to achieve high repeatability and measurement integrity across one-port devices.
Technical Specifications
• Frequency Range: 50 kHz to 1.6 GHz
• Offset Frequency Range: 0.01 Hz to 4 MHz (A-series standard)
• System Noise Response: Typically –180 dBc/Hz at offsets >10 kHz
• System Spurious Response: Typically –120 dBc
• Measurement Speed: Test times <3 seconds (1 kHz to 100 kHz offset) or <30 seconds (10 Hz to 1 MHz offset) for A-series
• Sensitivity:
– Key Features
• Phase noise and AM noise measurements on single platform
• Fast measurement capability enables rapid device characterization
• Integrated measurement software with PC control
• Low-noise frequency downconverters included
• RF spectrum analyzer integration
• Optional reference signal sources via Keysight 8662A/8663A/8643A/8644B/8664A/B/8665A generators
– Typical Applications
• One-port voltage-controlled oscillators (VCOs)
• Dielectric resonator oscillators (DROs)
• Crystal oscillators
• Synthesizer characterization
• Automated test equipment phase noise screening
• R&D oscillator development and validation
– Compatibility & Integration
The E5501A integrates into existing ATE systems with quick deployment on R&D benchtops. It accepts low-noise reference signals from standard Keysight signal generators, enabling flexible test architecture and multi-instrument measurement campaigns.
