The Keysight/Agilent/HP 11940A is a handheld near-field probe engineered for identifying and characterizing sources of radiated electromagnetic interference (EMI) at the component and circuit board level. Operating from 30 Hz to 100 kHz, this legacy probe enables precise localization of EMI sources through close-field measurement, making it essential for pre-compliance testing and root cause analysis of electronic device failures.
## Technical Specifications
• **Frequency Range:** 30 Hz to 100 kHz
• **Probe Type:** Near-field probe
• **Connector:** BNC
• **Impedance:** Optimized for standard spectrum analyzer and EMI receiver input impedances
## Key Features
• Detects low-level emissions for identification of subtle EMI sources
• Flexible cable design for maneuverability across device surfaces
• Handheld form factor suited for laboratory and field environments
• Durable construction for sustained operational use
## Typical Applications
• Pre-compliance EMI testing prior to formal certification
• Troubleshooting electronic products exhibiting EMI problems
• Characterizing emission signatures from specific components and circuit traces
• Design debugging to minimize radiated emissions
## Compatibility & Integration
The 11940A interfaces directly with spectrum analyzers and EMI receivers. Measurement is performed by sweeping the probe across the surface under test; the probe’s output displays areas of high emission when connected to a spectrum analyzer. The probe is designed for effective signal transfer with typical test equipment input impedances.
