The Keysight/Agilent/HP E5515-61231 Demodulating Downconverter is a modular RF frontend designed to extend network analyzer capabilities for characterizing modulated signals. It downconverts input signals to intermediate frequencies suitable for processing while maintaining high conversion gain and low noise figure, enabling precise measurement of amplitude, phase, and frequency characteristics across multiple cellular technologies.
## Technical Specifications
• Frequency Range: 292 to 2700 MHz
• Output Level Range (with modulation): –110 to –13 dBm
• VSWR: <1.2:1 (400 to 2000 MHz); <1.14:1 (400 to 1000 MHz)
• Channel Power Measurement Accuracy: <±1.0 dB (E5515E platform); <±1.1 dB (E5515B platform)
• Level Accuracy: ±1.0 dB from –110 dBm to –13 dBm in GSM, EGSM, DCS1800, and PCS1900 bands; typical ±0.5 dB
• Source Level Repeatability: Better than ±0.1 dB
• RF Spectrum Measurement Uncertainty (carrier offsets to ±1800 kHz): ±1.5 dB; typical ±0.7 dB at ±400 kHz offset
• Operating Temperature: 0°C to +55°C
## Key Features
• High conversion gain and low noise figure for precise modulated signal analysis
• Supports GSM/GPRS/EGPRS/E-EDGE, W-CDMA/HSPA/HSPA+/DC-HSDPA/DB-DC-HSDPA/HSDPA-MIMO, cdma2000/1xEV-DO/eHRPD, TD-SCDMA/TD-HSDPA/TD-HSUPA, IS-95, TIA/EIA-136, and AMPS modulation formats
• Excellent source level repeatability and spectral measurement accuracy across offset frequencies
## Typical Applications
• Wireless device design verification and characterization
• Cellular technology testing and validation
• Modulated signal analysis in manufacturing environments
## Compatibility & Integration
The E5515-61231 integrates with Keysight's 8960 Series 10 Wireless Communications Test Set platform, specifically the E5515C and E5515E models. These systems support comprehensive wireless device testing across design, verification, and manufacturing phases.
