The Keysight (Agilent) N3383A is a 3-port RF vector network analyzer delivering high-accuracy S-parameter measurements across 0.3 kHz to 9 GHz. Built on the PNA Series platform, this instrument combines four independent receivers with 128 dB dynamic range at the test port and up to 143 dB with direct receiver access. It excels in mixer/converter characterization, antenna measurements, pulsed-RF testing, and mm-wave applications where measurement speed and precision are critical.
The N3383A achieves 35 µs/point sweep speeds while maintaining transmission uncertainties as low as ±0.011 dB (300 kHz to 1.3 GHz) and reflection uncertainties of ±0.040 dB over the same band. Configurable IF bandwidth from 1 Hz to 40 kHz enables noise optimization across diverse test scenarios. Maximum output power reaches 10 dBm, with dynamic range specifications varying by frequency band—up to 118 dB at receiver input (3 GHz to 6 GHz). Direct receiver access capabilities support advanced measurement configurations requiring external signal injection or component-level diagnostics.
Technical Specifications
• Frequency Range: 0.3 kHz to 9 GHz
• Port Configuration: 3-port analyzer with 4 independent receivers
• Dynamic Range: 128 dB (test port), 143 dB (direct receiver access); 115 dB receiver input (300 kHz–3 GHz), 118 dB (3–6 GHz), 113 dB (6–9 GHz)
• Output Power: 10 dBm maximum
• Sweep Speed: 35 µs/point
• IF Bandwidth: 1 Hz to 40 kHz in 1, 2, 3, 5, 7, 10 sequence
• Transmission Uncertainty: ±0.011 dB (0.3–1.3 GHz) to ±0.054 dB (6–9 GHz)
• Reflection Uncertainty: ±0.040 dB (0.3–3 GHz) to ±0.070 dB (6–9 GHz)
• Directivity: ±0.006 dB (0.3–1.3 GHz) to ±0.010 dB (6–9 GHz)
– Key Features
• Four-receiver architecture enabling simultaneous multi-port characterization
• Low-noise measurement with selectable IF bandwidth for trace noise optimization
• High-speed acquisition—35 µs per measurement point for production throughput
• Frequency-dependent accuracy specifications ensure reliable results across the full band
– Typical Applications
• High-accuracy mixer and converter testing
• Antenna characterization and tuning
• Pulsed-RF component evaluation
• Millimeter-wave subsystem validation
• R&D and manufacturing parameter extraction
