The Keysight UXR0704A Infiniium UXR-Series Real-Time Oscilloscope delivers 70 GHz bandwidth across four full-bandwidth channels with 256 GSa/s sample rate and 10-bit ADC resolution. Purpose-built for high-speed signal analysis in research, development, and validation workflows, this instrument combines ultra-low intrinsic jitter of 20 fs (typical) with inter-channel jitter below 10 fs (rms) to capture complex signals with exceptional fidelity. The 200 Mpts standard memory per channel expands to 2 Gpts maximum, supporting extended acquisitions. Bandwidth upgrades to 110 GHz enable future-ready measurements on devices.
Technical Specifications
• Bandwidth: 70 GHz (upgradable to 110 GHz)
• Channels: 4 full bandwidth channels
• Sample Rate: 256 GSa/s on all channels
• Vertical Resolution: 10-bit ADC; >14 bits with averaging
• Memory Depth: 200 Mpts standard per channel; up to 2 Gpts maximum
• Input Impedance: 50 ohms ±3%
• Input Connector: 1.85 mm male with AutoProbe III jack
• Input Sensitivity (Display): 1 mV/div to 500 mV/div
• Input Sensitivity (Hardware): 60 mV full scale to 4.0 V full scale
• Offset Accuracy: ±2% of channel offset ±1% of full scale
• Intrinsic Jitter: 20 fs (typical)
• Inter-channel Jitter: 400 mVfs; 5.0 typical at 40 mVfs
• Measurement Acceleration: 5 trillion integer operations per second (IOPS)
– Key Features
• Hardware-accelerated measurement ASIC for real-time processing
• High-speed Serial Data Analysis (SDA) and Clock Recovery included
• Embedded protocol decode and trigger for USB2.0, eUSB2, 10/100 ETH, and PCIe 2/1
• Low-speed protocol decode/trigger support: I2C, SPI, RS232, I2S, JTAG
• User-defined functions and optional on-site self-calibration module
• AutoProbe II and AutoProbe III interface compatibility
– Physical and Electrical
• Power Requirements: 200 VAC to 240 VAC at 50/60 Hz; maximum 2615 VA
• Weight: 42.05 kg (92.7 lbs)
• Dimensions: 435 mm W (without handles); 513 mm D; 311 mm H (7U)
– Typical Applications
High-speed serial protocol analysis, clock recovery and jitter measurement, advanced signal integrity validation, and multi-channel time-correlated measurements across 70 GHz systems.
