The Laser Precision TD2000 is an ultra-fast timing discriminator engineered for leading-edge pulse detection and GHz-rate signal processing. It delivers fast NIM-compatible outputs with shaped and unshaped modes, enabling high-speed timing applications in nuclear instrumentation, particle physics, and precision measurement systems. The unit combines sub-nanosecond timing resolution with flexible threshold control and veto logic in a compact benchtop form factor.
Technical Specifications
• Product Type: Ultra Fast Timing Discriminator with GHz LE operation
• Input to Unshaped Output Delay: ~1.7 ns
• Input to Shaped Output Delay: ~3.3 ns
• Signal Input: BNC, 50 Ω, direct coupled, -2.0 to +3.0 V, sensitivity 5 V/µs
• Threshold Input: ±1.25 V, 10-turn precision potentiometer with 2 mm monitor test point
• Veto Input: BNC, 50 Ω, direct coupled, -300 mV threshold, fast NIM compatible, slew rate >5 V/µs
• Unshaped Outputs: 2× BNC, 50 Ω back-terminated, fast NIM current mode, -16 mA into 50 Ω, inverting and non-inverting, 2.4 GHz (3 dB) bandwidth
• Shaped Negative Output: Fast NIM current mode, 50 Ω back-terminated, -16 mA into 50 Ω, 400 MHz continuous rate
• Shaped Positive Output: Voltage follower mode, VOL +2.0 V into 50 Ω (for widths >2 ns)
• Pulse Width (Shaped): 10-turn screwdriver adjustable, 350 ns, typically 750 ps minimum
• Rise Time (Positive Output): ~500 ps
• Fall Time (Fast NIM Outputs): <200 ps
• Enclosure: Extruded aluminum sheath (Al Mg Si 0.5), die-cast aluminum lid (GD-Al Si 12)
• Absolute Maximum Supply Rating: 25 V (100 ms maximum)
– Key Features
• Leading-edge discrimination with sub-nanosecond timing precision
• Dual unshaped outputs for GHz-range applications
• Fast NIM veto input for shaped output inhibition
• Programmable pulse width shaping from 350 ns
• High-speed signal path with 2.4 GHz bandwidth on unshaped channels
– Typical Applications
• Nuclear and particle physics instrumentation
• Precision timing in scintillation detector systems
• High-rate pulse processing and event triggering
• Time-of-flight measurements requiring nanosecond resolution
