The LeCroy 9354AL is a 500 MHz, 4-channel digital oscilloscope engineered for advanced signal analysis in research, development, and testing environments. It delivers 500 MSa/s per-channel sampling with optional boost to 2 GSa/s single-channel or 10 GS/s on repetitive signals, coupled with up to 8 M points combined acquisition memory. The instrument provides 8-bit vertical resolution (expandable to 11 bits with ERES), vertical sensitivity from 2 mV/div to 5 V/div, and dual input impedance options (1 MΩ // 14 pF or 50 Ω). Advanced triggering includes edge, pattern, glitch (1 ns), width, dropout, state-qualified, and video modes, with trigger sensitivity of 1 div p-p across the full 500 MHz bandwidth. The 9-inch monochrome CRT displays at 810 × 696 resolution and supports Normal, X-Y, and persistence modes. Time base ranges from 1 ns/div to 1000 s/div with ±0.01% accuracy, while pre-trigger recording captures 0–100% of full scale and post-trigger delay extends to 10,000 divisions.
Technical Specifications
• Bandwidth: 500 MHz
• Channels: 4
• Sampling Rate: 500 MSa/s per channel; 2 GSa/s single channel; 10 GS/s repetitive
• Record Length: 2 M words per channel; up to 8 M points combined
• Vertical Resolution: 8 bits (11 bits with ERES option)
• Vertical Sensitivity: 2 mV/div to 5 V/div
• Input Impedance: 1 MΩ // 14 pF or 50 Ω ±1%
• Input Coupling: AC, DC, GND
• Maximum Input Voltage: ±20 V (with AP 020 FET probe); 250 V DC + peak AC ≤10 kHz on 1 MΩ input
• Bandwidth Limiter: 30 MHz
• Time Base: 1 ns/div to 1000 s/div; ±0.01% accuracy
• Display: 9-inch monochrome CRT, 810 × 696 points
– Key Features
• Glitch trigger captures 1 ns events
• Pattern and width triggering with selectable limits from <2.5 ns to 20 s
• Dropout trigger with configurable timeout (25 ns to 20 s)
• State/edge-qualified triggering across multiple sources
• Video trigger supports PAL, SECAM, NTSC, and nonstandard formats
• Pre-trigger recording and 10,000-division post-trigger delay
• Holdoff by events up to 99,999,999
• Roll mode (500 ms to 1,000 s/div)
– Typical Applications
Complex signal characterization, multi-channel system debugging, timing analysis, video signal verification, and glitch detection in high-speed digital and analog circuits.
– Compatibility & Integration
Accepts external trigger sources; supports FET probe inputs for elevated voltage measurements.
