The LeCroy HDO6104 is a 1 GHz, 4-channel oscilloscope designed for high-fidelity signal capture and complex waveform analysis. Built on Teledyne LeCroy’s HD4096 technology, it delivers 12-bit ADC resolution—expandable to 15 bits with enhanced resolution—providing 16 times more vertical resolution than conventional 8-bit instruments. This eliminates quantization error and ensures precise signal representation across demanding measurement tasks.
With a 2.5 GS/s sampling rate across all four channels and a 12.1-inch WXGA multi-touch display, the HDO6104 captures high-speed transients with exceptional detail and presents complex data intuitively. The real-time timebase spans 20 ps/div to 10,000 s/div, while Random Interleaved Sampling (RIS) mode extends effective sampling to 125 GS/s for repetitive signals.
Technical Specifications
• Bandwidth: 1 GHz (350 MHz and 500 MHz options available)
• Analog Channels: 4 channels
• Sample Rate: 2.5 GS/s per channel; enhanced sampling up to 10 GS/s supported
• ADC Resolution: 12-bit (expandable to 15 bits with enhanced resolution)
• Memory Depth: 50 Mpts/channel standard; expandable to 250 Mpts/channel
• Input Impedance: 1 MΩ ±2.0% || 15 pF or 50 Ω ±2.0%
• Vertical Sensitivity: 1 mV/div to 10 V/div (1 MΩ); 1 mV/div to 1 V/div (50 Ω)
• Rise Time: 350 ps typical (10%-90%, 50 Ω)
• Jitter Noise Floor: 700 fs
• Signal-to-Noise Ratio: 55 dB
• Timebase Range: 20 ps/div to 10,000 s/div (real-time); RIS up to 125 GS/s
• Display: 12.1-inch WXGA multi-touch color display
• Processor: Intel Core 3-201E, 3.6 GHz with 16 GB RAM standard
– Key Features
• HD4096 12-bit ADC technology with 15-bit enhanced resolution option
• Bandwidth limiters at 20 MHz and 200 MHz
• Advanced trigger types: edge, pulse width, runt, video, logic, pattern, serial data, and measurement parameter triggers
• Serial data triggering with protocol-specific message support
• Spectrum analyzer mode for frequency domain analysis
• WaveScan search and discovery functionality
– Typical Applications
Precision debugging of mixed-signal systems, serial protocol analysis, high-speed signal characterization, and frequency domain measurements requiring superior vertical resolution and low quantization noise.
