The LeCroy WaveRunner 204MXi is a 2 GHz, 4-channel digital oscilloscope engineered for signal validation, debug, and complex electronic design testing. It combines 10 GS/s total sampling (5 GS/s per channel), up to 25 Mpts of interleaved memory, and advanced triggering intelligence to isolate specific signal events with nanosecond precision. The instrument delivers comprehensive math, jitter analysis, and measurement capabilities alongside a 10.4-inch color touchscreen display and intuitive front-panel controls for efficient waveform analysis in lab and field environments.
Technical Specifications
• Bandwidth: 2.0 GHz analog
• Channels: 4 analog input
• Sample Rate: 10 GS/s total; 5.00 GSa/s per channel
• Memory Depth: 12.5 Mpts standard; 25 Mpts maximum (interleaved)
• Display: 10.4-inch color TFT-LCD SVGA touchscreen with stylus
• Connectivity: 10/100Base-T Ethernet, USB 2.0 (×5), SVGA video output, audio input
– Key Features
• Advanced Triggering: SMART Triggers isolate widths, glitches, logic patterns, dropouts, intervals, runts, and slew rates. Minimum trigger width: 1 ns (500 ps for width/glitch). Serial, digital, and timeout-qualified edge triggers included.
• WaveScan Search: Over 20 search/scan modes with Scan Overlay and ScanHisto functions for rapid event detection across acquisition memory.
• Sequence Mode: Segments memory for multi-event capture over extended periods with independent analysis per segment.
• Measurement & Analysis: Up to 8 simultaneous measurement parameters with statistics (mean, min, max, standard deviation). Histogram support to 2 billion events. Track display shows signal variation over time.
• Customizable Math: MATLAB, Excel, and VBScript support for user-defined measurement parameters and math functions.
• WaveShape Analysis: Dedicated advanced signal shape characterization.
• LabNotebook Report Generator: Captures waveforms, settings, screen images, and handwritten annotations on signals.
• QuickZoom: Front-panel, touchscreen, or mouse-driven zoom region selection.
• WaveStream Fast Viewing Mode: Optimized acquisition display for rapid signal observation.
– Typical Applications
• Digital circuit design debug and validation
• Jitter and timing characterization
• Multi-channel signal integrity analysis
• Serial protocol and bus trigger-based testing
– Compatibility & Integration
Ethernet and USB interfaces support direct instrument control, data transfer, and integration into automated test environments.
