The PHOTONETICS TUNICS-OM 3646 HE 15 with option P6 is a tunable laser source module for precision optical testing and component characterization. This high output power configuration delivers +6 dBm optical output with wavelength tunability across the C-band, supporting both analog and digital modulation for dynamic measurement scenarios.
Technical Specifications
• Wavelength Range: 1520 nm to 1570 nm
• Wavelength Resolution: Better than 10 pm (0.01 nm typical); optional 1 pm high-resolution available
• Optical Output Power (Option P6): +6 dBm (approximately 4 mW)
• Optical Power Stability: ±0.01 dB
• Side Mode Suppression Ratio: >45 dB (typical)
• Relative Intensity Noise: >145 dB/Hz (typical)
• Output Isolation: 35 dB
• Return Loss: 60 dB
• Fiber Output: SMF-28™, FC/APC connector
• Analog Modulation: 150 Hz to 1 GHz (external)
• Digital Modulation: 500 Hz to 1 MHz (internal or external)
• External Intensity Modulation: 10 kHz to 1 GHz
• Control Interfaces: RS-232 C and IEEE-488.2
• Operating Temperature: +15 to +30°C
• Power Supply: 100 to 240 V, 50 to 60 Hz (autoselect)
– Key Features
• Fine wavelength tuning (0.01 nm steps) enables precise component testing across the C-band
• Excellent spectral purity with >45 dB side mode suppression and >145 dB/Hz RIN
• Dual modulation capability—analog and digital—supports diverse measurement protocols
• High return loss (60 dB) and output isolation (35 dB) minimize backreflection effects
• Modular 35 × 130 × 250 mm³ form factor; up to 8 modules integrate into a single 19″ rack chassis
– Typical Applications
• Component characterization (filters, couplers, amplifiers, detectors)
• Chromatic dispersion and PMD measurement
• Optical network validation and troubleshooting
• Wavelength-dependent optical system performance assessment
– Compatibility & Integration
The module operates as a standalone bench instrument or within a multi-module 19″ mainframe platform (448 × 133 × 370 mm³; 16.1 kg for 8-module configuration). RS-232 C and IEEE-488.2 interfaces enable local control and remote automation within test racks.
